Search Results1-20 of  62

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  • KAWAKATSU Hideki ID: 9000017449556

    Articles in CiNii:1

    • 研究速報 : Design of a Positioning Table Using Crystalline Lattice and Surface Topography as a Reference Index (1988)
  • KAWAKATSU Hideki ID: 9000017554811

    Articles in CiNii:1

    • 研究速報 : A Dual-Tunneling-Unit STM : application as a nm order measuring machine and a positioning table (1989)
  • KAWAKATSU Hideki ID: 9000018608735

    Articles in CiNii:1

    • 特集18 : 研究速報 : Towards Micro Magnetic Bearings (1993)
  • KAWAKATSU Hideki ID: 9000392844879

    Articles in CiNii:1

    • 研究解説 : A Linear Encoder Using a Crystal as a Reference (2001)
  • KAWAKATSU Hideki ID: 9000392844889

    Articles in CiNii:1

    • 研究解説 : Mapping of Lateral Vibration Amplitude of the Tip at a Sub-Atomic Level in Contact Mode Atomic Force Microscopy (2001)
  • KAWAKATSU Hideki ID: 9000392844892

    Articles in CiNii:1

    • 研究解説 : SEM-AFM for 3D Nano-Structure Measurement (2001)
  • KAWAKATSU Hideki ID: 9000392844898

    Articles in CiNii:1

    • 研究解説 : Fabrication of Nanometric Oscillators (2001)
  • KAWAKATSU Hideki ID: 9000392844903

    Articles in CiNii:1

    • 研究解説 : Characterization of Silicon Nanocantilevers (2001)
  • Hideki Kawakatsu ID: 9000005933793

    Insitute of Industrial Science (2006 from CiNii)

    Articles in CiNii:1

    • Kenkyu kaisetu "Atomic force microscopy utilizing subangstrom cantilever amplitudes" (2006)
  • KAWAKATSU Hideki ID: 9000002407317

    Institute of Industrial Science, University of Tokyo (2000 from CiNii)

    Articles in CiNii:4

    • A Silicon Based Nanometric Oscillator for Scanning Force Microcopy Operating in the 100MHz Range (1999)
    • Development of a Versatile Atomic Force Microscope within a Scanning Electron Microscope (2000)
    • Fabrication of Silicon - Based Filiform - Necked Nanometric Oscillators (2000)
  • KAWAKATSU Hideki ID: 9000005736796

    Institute of Industrial Science, University of Tokyo (1995 from CiNii)

    Articles in CiNii:1

    • Dual Optical Levers for Atomic Force Microscopy (1995)
  • KAWAKATSU Hideki ID: 9000005748678

    Institute of Industrial Science, University of Tokyo (1999 from CiNii)

    Articles in CiNii:1

    • Feasibility Studies on a Nanometric Oscillator Fabricated by Surface Diffusion for Use as a Force Detector in Scanning Force Microscopy (1999)
  • KAWAKATSU Hideki ID: 9000017579025

    Institute of Industrial Science, University of Tokyo:JST-CREST (2009 from CiNii)

    Articles in CiNii:1

    • SIM-13 SIMULATION OF PICO-FORCE DETECTION IN LATERAL-MODE DYNAMIC AFM(Simulations of Micro/Nano Scale Phenomena IV,Technical Program of Oral Presentations) (2009)
  • KAWAKATSU Hideki ID: 9000021596108

    Articles in CiNii:1

    • Making Five Atomic Force Microscope for 200,000 yen each:—A student project— (2004)
  • KAWAKATSU Hideki ID: 9000021596697

    Articles in CiNii:1

    • Application of Nanomachining to Scanning Probe Microscopy (2002)
  • KAWAKATSU Hideki ID: 9000021597015

    Articles in CiNii:1

    • Development of SEM-AFM for evaluation of 3D nanometric structures (2000)
  • KAWAKATSU Hideki ID: 9000021623170

    Articles in CiNii:1

    • Building and testing of a liquid Atomic Force Microscope for imaging of biological samples. (2009)
  • KAWAKATSU Hideki ID: 9000021624926

    Center for International Research on Micro-Mechatronics, Institute of Industrial Science, The University of Tokyo. (2001 from CiNii)

    Articles in CiNii:1

    • Fabrication of Nanometric Oscillators (2001)
  • KAWAKATSU Hideki ID: 9000021625028

    Center for International Research on Micro-Mechatronics, Institute of Industrial Science, The University of Tokyo. (2001 from CiNii)

    Articles in CiNii:1

    • Fabrication of Nanometric Oscillators (2001)
  • KAWAKATSU Hideki ID: 9000021625109

    Articles in CiNii:1

    • Measurement and control in the atomic level (2000)
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