Search Results1-10 of  10

  • KAWANAKA Ryusuke ID: 9000000063041

    日本エム・アール・シー(株) (1995 from CiNii)

    Articles in CiNii:1

    • Reliability of Semiconductor Devices (1995)
  • KAWANAKA Ryusuke ID: 9000001631739

    関西品質技術研究所 (2008 from CiNii)

    Articles in CiNii:3

    • Nucleation and Growth Mechanism of Tin Whiskers (2005)
    • 300:29:1 (2006)
    • 2-1 材料事故と材料技術(その1) : 材料のオモテウラと材料特性(セッション2「故障解析、部品、要素技術の信頼性」) (2008)
  • KAWANAKA Ryusuke ID: 9000005803151

    摂南大学 (2001 from CiNii)

    Articles in CiNii:3

    • Report on the 3rd Technical Meeting of REAJ Kansai Branch (2001)
    • 1b-1 材料信頼性技術と評価試験(第7回信頼性シンポジウム) (1994)
    • 第7回信頼性シンポジウム報告 (1995)
  • Kawanaka Ryusuke ID: 9000004336050

    三菱電機 (1985 from CiNii)

    Articles in CiNii:10

    • 錫ホイスカの観察V : ホイスカおよびモルフォロジー (1983)
    • 錫ウィスカの観察 VIII : モルフォロジーII (1985)
    • 錫ウイスカの観察I : XMA : ひげ結晶と金属 (1980)
  • Kawanaka Ryusuke ID: 9000005057905

    Mitsubishi Electric Corp. (1984 from CiNii)

    Articles in CiNii:1

    • Reliability Evaluation of Microfabrication (Micro Processings of Materials) (1984)
  • Kawanaka Ryusuke ID: 9000252952946

    Kitaitami Works, Mitsubishi Electric Corporation (1983 from CiNii)

    Articles in CiNii:1

    • Influence of Impurities on the Growth of Tin Whiskers (1983)
  • Kawanaka Ryusuke ID: 9000254204310

    Mitsubishi Electric Corp. (1984 from CiNii)

    Articles in CiNii:1

    • Micro processings of materials. Reliability evaluation of microfabrication. (1984)
  • Kawanaka Ryusuke ID: 9000392694864

    Articles in CiNii:1

    • Influence of Impurities on the Growth of Tin Whiskers (1983)
  • Kawanaka Ryusuke ID: 9000392786610

    Articles in CiNii:1

    • On the Fine Bands Appearing in the Electron-Micrograph of Martensite of Kovar (1959)
  • Kawanaka Ryusuke ID: 9000401593295

    Articles in CiNii:1

    • Influence of Impurities on the Growth of Tin Whiskers (1983)
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