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  • KAWAUCHI Taizou ID: 9000001814700

    Institute of Industrial Science, University of Tokyo (2006 from CiNii)

    Articles in CiNii:1

    • Precision Measurement of ^<83>Kr Mossbauer Wavelength (2006)
  • Kawauchi Taizou ID: 9000025108511

    Articles in CiNii:1

    • Structure of Iron Silicide film on Si(111) Grown by Solid-Phase Epitaxy and Reactive Deposition Epitaxy (Special Issue: Scanning Tunneling Microscopy/Spectroscopy and Related Techniques) (2006)
  • Kawauchi Taizou ID: 9000401755209

    Articles in CiNii:1

    • 2006-01-27 (2006)
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