Search Results1-10 of  10

  • KIM Su Chol ID: 9000005535150

    Department of Electrical Engineering, Osaka University (1980 from CiNii)

    Articles in CiNii:2

    • Si(LMM) Auger Electron Emission from Si Alloys by keV Ar_+ Ion Bombardment, New Effect and Application (1979)
    • Low Temperature Alloyed Contact Formation in Various Metal-Semiconductor Couples : B-5: COMPOUND SEMICONDUCTOR DEVICE TECHNOLOGY (1980)
  • Kim Su Chol ID: 9000252946723

    Department of Electrical Engineering, Osaka University (1979 from CiNii)

    Articles in CiNii:1

    • Si(LMM) auger electron emission from Si alloys by keV Ar+ ion bombardment, new effect and application. (1979)
  • Kim Su Chol ID: 9000401584754

    Articles in CiNii:1

    • Si(LMM) Auger Electron Emission from Si Alloys by keV Ar+Ion Bombardment, New Effect and Application (1979)
  • Kim Su Chol ID: 9000401585937

    Articles in CiNii:1

    • Origin of Si(LMM) Auger Electron Emission from Silicon and Si-Alloys by keV Ar+Ion Bombardment (1980)
  • Kim Su Chol ID: 9000401590724

    Articles in CiNii:1

    • Sputtering Yields of Si and Ni from the Ni1-xSixSystem Studied by Rutherford Backscattering Spectrometry (1982)
  • Kim Su Chol ID: 9000402054618

    Articles in CiNii:1

    • Low Temperature Alloyed Contact Formation in Various Metal-Semiconductor Couples (1980)
  • Kim Su Chol ID: 9000252948561

    Department of Electrical Engineering, Osaka University (1980 from CiNii)

    Articles in CiNii:1

    • Origin of Si(LMM) Auger Electron Emission from Silicon and Si-Alloys by keV Ar<SUP>+</SUP> Ion Bombardment (1980)
  • Kim Su Chol ID: 9000252950701

    Department of Electrical Engineering, Osaka University (1982 from CiNii)

    Articles in CiNii:1

    • Sputtering Yields of Si and Ni from the Ni<SUB>1−<I>x</I></SUB>Si<I><SUB>x</SUB></I> System Studied by Rutherford Backscattering Spectrometry (1982)
  • Kim Su Chol ID: 9000392684729

    Articles in CiNii:1

    • Sputtering Yields of Si and Ni from the Ni<SUB>1−<I>x</I></SUB>Si<I><SUB>x</SUB></I> System Studied by Rutherford Backscattering Spectrometry (1982)
  • Kim Su Chol ID: 9000392689564

    Articles in CiNii:1

    • Origin of Si(LMM) Auger Electron Emission from Silicon and Si-Alloys by keV Ar<SUP>+</SUP> Ion Bombardment (1980)
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