Search Results61-80 of  100

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  • Kim Yong Tae ID: 9000401652514

    Articles in CiNii:1

    • The Characteristics of Nitrogen Implanted Tungsten Film as a New Diffusion Barrier for Metal Organic Chemical Vapor Deposited Cu Metallization (1995)
  • Kim Yong Tae ID: 9000401659518

    Articles in CiNii:1

    • Advantages of RuOxBottom Electrode in the Dielectric and Leakage Characteristics of (Ba,Sr)TiO3Capacitor (1996)
  • Kim Yong Tae ID: 9000401669116

    Articles in CiNii:1

    • Negative Resistance of AlGaAs Diodes Co-doped with Si and Mn (1997)
  • Kim Yong Tae ID: 9000401670569

    Articles in CiNii:1

    • Characteristics of Metal/Ferroelectric/Insulator/Semiconductor Field Effect Transistors Using a Pt/SrBi2Ta2O9/Y2O3/Si Structure (1998)
  • Kim Yong Tae ID: 9000401673601

    Articles in CiNii:1

    • Electrical Properties of Pt/SrBi2Ta2O9/CeO2/SiO2/Si Structure for Nondestructive Readout Memory (1998)
  • Kim Yong Tae ID: 9000401674352

    Articles in CiNii:1

    • Effects of Morphological Changes of Pt/SrBi2Ta2O9Interface on the Electrical Properties of Ferroelectric Capacitor (1998)
  • Kim Yong Tae ID: 9000401680633

    Articles in CiNii:1

    • N2+Implantation Approaches for Improving Thermal Stability of Cu/Mo/Si Contact Structure (1999)
  • Kim Yong Tae ID: 9000401696310

    Articles in CiNii:1

    • 2001-03-15 (2001)
  • Kim Yong Tae ID: 9000401698186

    Articles in CiNii:1

    • Electrical Characteristics of Pt/SrBi2Ta2O9/Ta2O5/Si Using Ta2O5as the Buffer Layer (2001)
  • Kim Yong Tae ID: 9000401699670

    Articles in CiNii:1

    • Effects of Rapid Thermal Annealing on the Electrical Properties of Cobalt Contact top-GaN (2001)
  • Kim Yong Tae ID: 9000401707356

    Articles in CiNii:1

    • Effects of NH3Plasma Treatment on Methyl Silsequioxane for Copper Multi-Level Interconnect (2002)
  • Kim Yong Tae ID: 9000401713283

    Articles in CiNii:1

    • Influence of Thickness on the Emission Threshold Field of the Pb(Zr0.4Ti0.6)O3 (PZT) Films (2002)
  • Kim Yong Tae ID: 9000401716764

    Articles in CiNii:1

    • Growth and Characterization of Triangular InGaAs/GaAs Quantum Wire Structures Grown by Low-Pressure Metalorganic Chemical Vapor Deposition (2003)
  • Kim Yong Tae ID: 9000401718361

    Articles in CiNii:1

    • Metal Oxide Semiconductor Field Effect Transistor Characteristics with Iridium Gate Electrode on Atomic Layer Deposited ZrO2High-kDielectrics (2003)
  • Kim Yong Tae ID: 9000401719786

    Articles in CiNii:1

    • A New Pulse Plasma Enhanced Atomic Layer Deposition of Tungsten Nitride Diffusion Barrier for Copper Interconnect (2003)
  • Kim Yong Tae ID: 9000401736877

    Articles in CiNii:1

    • Effects of Annealing Conditions on the Crystallization and Grain Growth of Metastable Ge2Sb2Te5 (2005)
  • Kim Yong Tae ID: 9000401775112

    Articles in CiNii:1

    • 2008-10-17 (2008)
  • Kim Yong Tae ID: 9000401783314

    Articles in CiNii:1

    • 2009-10-20 (2009)
  • Kim Yong Tae ID: 9000401977660

    Articles in CiNii:1

    • Understanding of relationship between dopant and substitutional site to develop novel phase-change materials based on In3SbTe2 (2019)
  • Kim Yong Tae ID: 9000401977889

    Articles in CiNii:1

    • Characteristics of band modulation FET on sub 10 nm SOI (2019)
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