Search Results1-20 of  33

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  • Kozo Kinoshita ID: 9000347529356

    Articles in CiNii:1

    • On the Effect of Size of Fault Word in Parallel Fault Simulation (1986)
  • KINOSHITA KOZO ID: 9000364925709

    Wakayama Experiment Station of Medicinal Plants, National Institute of Hygienic Sciences (1981 from CiNii)

    Articles in CiNii:22

    • ケシ(Papaver somniferum L.)の耐病性系統の生産力について (1977)
    • ケシ(Papaver somniferum L.)の早生型系統の生産力について (1975)
    • ケシ(Papaver somniferum L.)早生一貫の育成について (1964)
  • KINOSHITA Kozo ID: 1000000028995

    Graduate School of Computer Science, Osaka Gakuin University (2012 from CiNii)

    Articles in CiNii:71

    • Removal of Redundancy in Combinational Circuits by Classification of Undetectable Faults (1992)
    • On Speed-Up of Fault Simulation for Handling Intermediate Faulty Voltages (2005)
    • Throughput Analysis of End-to-End ARQ Protocol over Tandem Links : The case of Generalized Go-Back-N ARQ (1995)
  • KINOSHITA Kozo ID: 9000000522471

    Faculty of Engineering, Osaka University (1992 from CiNii)

    Articles in CiNii:1

    • Design of Testing Circuit and Test Generation for Built-in Current Testing (1992)
  • KINOSHITA Kozo ID: 9000003782370

    Faculty of Integrated Acts and Sciences, Hiroshima University (1989 from CiNii)

    Articles in CiNii:10

    • VLSIのテストと高信頼性 (システムにおける安全性と高信頼性<特集>) (1985)
    • マイクロコンピュ-タのソフトウェア開発手法 (システムと制御技術展′79特集号) (1979)
    • LSIの故障診断技術 (LSI試験技術<特集>) (1987)
  • KINOSHITA Kozo ID: 9000004535581

    Faculty of Informatics, Osaka Gakuin University (2002 from CiNii)

    Articles in CiNii:7

    • トライステ-ト素子を含む回路のテスト生成手法について (1989)
    • 活性化経路を利用した検査入力生成の効率化手法--PATHアルゴリズム (1990)
    • A Fault Simulation method for crosstalk faults in synchronous sequential circuits (1995)
  • KINOSHITA Kozo ID: 9000004801515

    Faculty of Engineering, Osaka University (1995 from CiNii)

    Articles in CiNii:1

    • Efficient Guided-Probe Fault Location Method for Sequential Circuits (1995)
  • KINOSHITA Kozo ID: 9000004802061

    Faculty of Engineering, Osaka University (1995 from CiNii)

    Articles in CiNii:1

    • Acceleration Techniques of Multiple Fault Test Generation Using Vector Pair Analysis (1995)
  • KINOSHITA Kozo ID: 9000004802080

    Faculty of Informatics, Osaka Gakuin University (2007 from CiNii)

    Articles in CiNii:8

    • On Design for I_<DDQ>-Based Diagnosability of CMOS Circuits Using Multiple Power Supplies(Computer Components) (2005)
    • Testing of k-FR Circuits under Highly Observable Condition (1995)
    • Transistor Leakage Fault Diagnosis with I_<DDQ> and Logic Information (1998)
  • KINOSHITA Kozo ID: 9000004802106

    Faculty of Engineering, Osaka University (1995 from CiNii)

    Articles in CiNii:1

    • Retiming for Sequential Circuits with a Specified Initial State and Its Application to Testability Enhancement (1995)
  • KINOSHITA Kozo ID: 9000004803741

    Dept. of Applied Physics, Faculty of Eng., Osaka University (1997 from CiNii)

    Articles in CiNii:1

    • A Fault Simulation Method for Crosstalk Faults in Synchronous Sequential Circuits (1997)
  • KINOSHITA Kozo ID: 9000004805691

    Dept. of Applied Physics, Faculty of Engineering, Osaka University (1999 from CiNii)

    Articles in CiNii:1

    • Power Estimation and Reduction of CMOS Circuits Considering Gate Delay (1999)
  • KINOSHITA Kozo ID: 9000004869515

    the Faculty of Engineering, Osaka University (1998 from CiNii)

    Articles in CiNii:1

    • Test Generation for Sequential Circuits under IDDQ Testing (1998)
  • KINOSHITA Kozo ID: 9000004869539

    The authors are with the Department of Applied Physics, Faculty of Engineering, Osaka University (1998 from CiNii)

    Articles in CiNii:1

    • Logic Optimization: Redundancy Addition and Removal Using Implication Relations (1998)
  • KINOSHITA Kozo ID: 9000005593456

    Department of Applied Physics, Osaka University (1998 from CiNii)

    Articles in CiNii:1

    • Solution of the Knapsack Problem by Deoxyribonucleic Acid Computing (1998)
  • KINOSHITA Kozo ID: 9000006500089

    Faculty of Informatics, Osaka Gakuin University (2002 from CiNii)

    Articles in CiNii:1

    • Reduction of the Target Fault List and Fault Simulation Method for Crosstalk Faults in Clock-Delayed Domino Circuits (2002)
  • KINOSHITA Kozo ID: 9000006500104

    Faculty of Informatics,Osaka Gakuin University (2002 from CiNii)

    Articles in CiNii:1

    • IDDQ Test Time Reduction by High Speed Charging of Load Capacitors of CMOS Logic Gates (2002)
  • KINOSHITA Kozo ID: 9000021556009

    Experimental Farm for the Cultivation of Medicinal Plants, attached to the National Hygienic (1956 from CiNii)

    Articles in CiNii:1

    • On colchicine-induced polyploid Insect Flower (<i>Chrysanthemum cinerariaefolium</i> Bocc.) (1956)
  • KINOSHITA Kozo ID: 9000242085212

    Osaka Gakuin University (2013 from CiNii)

    Articles in CiNii:1

    • SAT-Based Test Generation for Open Faults Using Fault Excitation Caused by Effect of Adjacent Lines (2013)
  • KINOSHITA Kozo ID: 9000253677096

    広島大学 総合科学部 (1985 from CiNii)

    Articles in CiNii:1

    • Testing and reliable design of VLSI. (1985)
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