Search Results1-9 of  9

  • KITAMURA Takafumi ID: 9000018706736

    Articles in CiNii:1

    • Effect of the Fukushima accident to Europe and the United States-The United States and France firmly keep nuclear power generation and Germany decided to gradually exit : International organizations promote sharing of information and lessons from Fukushima (2011)
  • KITAMURA Takafumi ID: 9000399346630

    同志社女子中学校・高等学校 (2018 from CiNii)

    Articles in CiNii:1

    • Practice of "electric circuit" ILDs for junior high school students (2018)
  • KITAMURA Takuya ID: 9000005557098

    Silicon Technology R&D Center, Sumitomo Sitix Corporation (1997 from CiNii)

    Articles in CiNii:5

    • A Proposed Atomic-Layer-Deposition of Germanium on Si(100) (1996)
    • Influence of Fe Contamination in Czochralski-Grown Silicon Single Crystals on LSI-Yield Related Crystal Quality Characteristics (1995)
    • Influence of Crystal-Originated "Particle" Microstructure on Silicon Wafers on Gate Oxide Integrity (1997)
  • Kitamura Takafumi ID: 9000258133457

    Research and Development Center, Sumitomo Sitix Corporation, Kohoku, Kishima–gun, Saga 849–05, Japan (1997 from CiNii)

    Articles in CiNii:1

    • A New Method for Transmission Electron Microscope Observation of Grown-in Defects in As-Grown Czochralski Silicon (111) Crystals. (1997)
  • Kitamura Takafumi ID: 9000258133473

    Silicon Technology R&D Center, Sumitomo Sitix Corporation, Kohoku–cho, Kishima–gun, Saga 849–05, Japan (1997 from CiNii)

    Articles in CiNii:1

    • Influence of Crystal-Originated "Particle" Microstructure on Silicon Wafers on Gate Oxide Integrity. (1997)
  • Kitamura Takafumi ID: 9000392101365

    Japan Atomic Energy Agency (2008 from CiNii)

    Articles in CiNii:1

    • approach for physical protection on nuclear material transportation (2008)
  • Kitamura Takafumi ID: 9000401650075

    Articles in CiNii:1

    • Influence of Fe Contamination in Czochralski-Grown Silicon Single Crystals on LSI-Yield Related Crystal Quality Characteristics (1995)
  • Kitamura Takafumi ID: 9000401666850

    Articles in CiNii:1

    • Influence of Crystal-Originated "Particle" Microstructure on Silicon Wafers on Gate Oxide Integrity (1997)
  • Kitamura Takafumi ID: 9000401666859

    Articles in CiNii:1

    • A New Method for Transmission Electron Microscope Observation of Grown-in Defects in As-Grown Czochralski Silicon (111) Crystals (1997)
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