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  • KIYOMURA Yoshihiro ID: 9000004754919

    Research & Development Lab., Kyoshu Matsushita Electric Co., Ltd. (2002 from CiNii)

    Articles in CiNii:2

    • Evaluation of Hardening of UV-light Cured Epoxy by Simultaneous Measurement of Refractive Index and Thickness Using the Low Coherence Interferometry (2002)
    • Simultaneous Measurement of Wavelength-Dispersive Refractive Index and Thickness using the Low Coherence Interferometry : Precise Measurement Applicable for Evaluation of Hardening of UV-light Cured Epoxy (1998)
  • KIYOMURA Yoshihiro ID: 9000004876264

    Research & Development Lab., Kyushu Matsushita Electric Co.,Ltd. (2002 from CiNii)

    Articles in CiNii:1

    • Evaluation of Hardening of UV-Light Cured Epoxy by Simultaneous Measurement of Refractive Index and Thickness Using the Low Coherence Interferometry (2002)
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