Search Results1-20 of  61

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  • Kotera Masatoshi ID: 9000025057716

    Articles in CiNii:1

    • Simulation of fogging electrons in electron beam lithography (Special issue: Microprocesses and nanotechnology) (2009)
  • Kotera Masatoshi ID: 9000025083259

    Articles in CiNii:1

    • Analysis of resist surface deformation during electron beam irradiation (Special issue: Microprocesses and nanotechnology) (2010)
  • KOTERA Masatoshi ID: 1000040170279

    Osaka Institute of Technology (2006 from CiNii)

    Articles in CiNii:37

    • Performance Analysis of the Mott Polarimeter (1997)
    • Analysis of Surface Magnetic Structure Using Type-I Magnetic Contrast in the Scanning Electron Microscope (1997)
    • Study on Sensitization of the Mott Polarimeter (1999)
  • KOTERA Masatoshi ID: 9000004811741

    Department of Electronic Engineering, Osaka Institute of Technology (1995 from CiNii)

    Articles in CiNii:1

    • Monte Carlo Calculations on the Passage of Electrons through Thin Films Irradiated by 300 keV Electrons (1995)
  • KOTERA Masatoshi ID: 9000006463016

    Department of Electronic Engineering, Osaka Institute of Technology Omiya (2002 from CiNii)

    Articles in CiNii:1

    • Line Edge Roughness of Developed Resist with Low-Dose Electron Beam Exposure (2002)
  • KOTERA Masatoshi ID: 9000021531012

    Department of Electronic Engineering, Osaka Institute of Technology (1999 from CiNii)

    Articles in CiNii:1

    • サマリー・アブストラクト (1999)
  • KOTERA Masatoshi ID: 9000107334156

    Osaka Institute of Technology (2001 from CiNii)

    Articles in CiNii:1

    • Influence of Electron Density Distribution at the Electron Source in a Projection Exposure System (2001)
  • KOTERA Masatoshi ID: 9000107349705

    Department of Electronics, Information and Communication Engineering, Osaka Institute of Technology (2004 from CiNii)

    Articles in CiNii:1

    • Influence of Electron Scattering on Resolution in Low-Dose Electron-Beam Lithography (2004)
  • KOTERA Masatoshi ID: 9000107350074

    Department of Electronics, Information and Communication Engineering, Osaka Institute of Technology (2004 from CiNii)

    Articles in CiNii:1

    • Calculation of Coulomb Interaction among Electrons in a High-Current Electron-Beam Exposure System (2004)
  • KOTERA Masatoshi ID: 9000107374809

    Osaka Institute of Technology, Department of Electronics, Information and Communication Engineering (2005 from CiNii)

    Articles in CiNii:1

    • Deposited Energy Dependence of Surface Roughness of Polymethylmethacrylate Irradiated by Electron Beam (2005)
  • KOTERA Masatoshi ID: 9000253647856

    Osaka Institute of Technology (1990 from CiNii)

    Articles in CiNii:1

    • Electron-solid interaction. Theoretical evaluation of the scanning electron microscope image. (1990)
  • Kotera Masatoshi ID: 9000002489574

    Graduate School of Law, Kobe University (1980 from CiNii)

    Articles in CiNii:1

    • Religious Policy under the Meiji Restoration : In Relation to the Policy of Separation between Shintoism and Buddhism (1980)
  • Kotera Masatoshi ID: 9000016267285

    Articles in CiNii:1

    • "Exhibitions and Experiments", in Celebration of Nobel Prize in Physics (2010)
  • Kotera Masatoshi ID: 9000024966206

    Articles in CiNii:1

    • Extreme ultraviolet lithography simulation by tracing photoelectron trajectories in resist (Special issue: Microprocesses and nanotechnology) (2008)
  • Kotera Masatoshi ID: 9000252762143

    Department of Electronic Engineering, Osaka Institute of Technology (1990 from CiNii)

    Articles in CiNii:1

    • A Simulation of Electron Scattering in Metals (1990)
  • Kotera Masatoshi ID: 9000252945598

    Electronics Department, College of Engineering, University of Osaka Prefecture (1978 from CiNii)

    Articles in CiNii:1

    • Remarks on the Calculation of Energy Loss in Electron-Resist Films on Substrates (1978)
  • Kotera Masatoshi ID: 9000252967786

    Department of Electronic Engineering, Osaka Institute of Technology (1989 from CiNii)

    Articles in CiNii:1

    • A Monte Carlo Simulation of Secondary Electron Trajectories in a Specimen (1989)
  • Kotera Masatoshi ID: 9000252972088

    Articles in CiNii:1

    • A Simulation of the Topographic Contrast in the SEM (1990)
  • Kotera Masatoshi ID: 9000252976437

    Department of Electronic Engineering, Osaka Institute of Technology (1991 from CiNii)

    Articles in CiNii:1

    • Theoretical Evaluation of a Topographic Contrast of Scanning Electron Microscope Images (1991)
  • Kotera Masatoshi ID: 9000252981136

    Department of Electronic Engineering, Osaka Institute of Technology (1992 from CiNii)

    Articles in CiNii:1

    • Theoretical Evaluation of Compositional Contrast of Scanning Electron Microscope Images (1992)
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