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  • KUGE Shigehiro ID: 9000004778601

    Mitsubishi Electric Corporation (1997 from CiNii)

    Articles in CiNii:4

    • SOI-DRAM Circuit Technologies for Low Power High Speed Multi-giga Scale Memories (1995)
    • Low Voltage / Low Power SOI-DRAM with Multiple Body Control Circuits (1996)
    • Automatic Voltage-Swing Reduction(AUR)Scheme for Ultra Low Power DRAMs (1994)
  • KUGE Shigehiro ID: 9000004813812

    the ULSI Laboratory, Mitsubishi Electric Corporation (1996 from CiNii)

    Articles in CiNii:2

    • SOI-DRAM Circuit Technologies for Low Power High Speed Multigiga Scale Memories (1996)
    • A Blanket Source Line Architecture with Triple Metal for Giga Scale Memory LSIs (1996)
  • KUGE Shigehiro ID: 9000107346735

    Articles in CiNii:1

    • An 8kB EEPROM-Emulation DataFLASH Module for Automotive MCU and Trend of Embedded Flash memory (2008)
  • Kuge Shigehiro ID: 9000252976119

    Department of Electrical Engineering, Faculty of Engineering, Kyushu University (1991 from CiNii)

    Articles in CiNii:1

    • Solubility and Diffusion Coefficient of Electrically Active Titanium in Silicon (1991)
  • Kuge Shigehiro ID: 9000392726065

    Articles in CiNii:1

    • Solubility and Diffusion Coefficient of Electrically Active Titanium in Silicon (1991)
  • Kuge Shigehiro ID: 9000401623092

    Articles in CiNii:1

    • Solubility and Diffusion Coefficient of Electrically Active Titanium in Silicon (1991)
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