Search Results1-10 of  10

  • KUO Li-Hsin ID: 9000005571745

    Joint Research Center for Atom Technology (JRCAT) (1998 from CiNii)

    Articles in CiNii:3

    • Characterization of ZnSe/GaAs(001) Heteroepitaxial Interfaces by X-Ray Reflectivity Measurement (1998)
    • Non-Contact and Non-Destructive Measurement of Carrier Concntration of Nitrogen-Doped ZnSe by Reflectance Difference Spectroscopy (1997)
    • Structural Change of As-Stabilized GaAs(001)-(2×4) and-c(4×4) Induced by Zinc Exposure (1997)
  • KUO Li-Hsin ID: 9000006471428

    Uni Light Technology Inc. (2002 from CiNii)

    Articles in CiNii:1

    • Oxygen and Hydrogen Implanted Oxidation Enhancement of Al_<0.98>Ga_<0.02>/Al_<0.7>Ga_<0.3>As Distributed Bragg Reflector Structure (2002)
  • Kuo Li Hsin ID: 9000258136456

    Joint Research Center for Atom Technology–Angstrom Technology Partnership, 1–1–4 Higashi, Tsukuba 305, Japan (1997 from CiNii)

    Articles in CiNii:1

    • Structural Change of As-Stabilized GaAs(001)-(2*4) and -c(4*4) Induced by Zinc Exposure. (1997)
  • Kuo Li Hsin ID: 9000401669631

    Articles in CiNii:1

    • Structural Change of As-Stabilized GaAs(001)-($\bf 2\times 4$) and -${\mbi c}(\bf 4\times 4)$ Induced by Zinc Exposure (1997)
  • Kuo Li-Hsin ID: 9000258159870

    Uni Light Technology Inc., Taoyuan, Taiwan, R.O.C. (2002 from CiNii)

    Articles in CiNii:1

    • Oxygen and Hydrogen Implanted Oxidation Enhancement of Al0.98Ga0.02As/Al0.7Ga0.3As Distributed Bragg Reflector Structure. (2002)
  • Kuo Li-Hsin ID: 9000401658856

    Articles in CiNii:1

    • Observation of <100> Dark Line Defects in Optically Degraded ZnSxSe1-x-based Light Emitting Diodes by Transmission Electron Microscopy (1996)
  • Kuo Li-Hsin ID: 9000401667192

    Articles in CiNii:1

    • Non-Contact and Non-Destructive Measurement of Carrier Concentration of Nitrogen-Doped ZnSe by Reflectance Difference Spectroscopy (1997)
  • Kuo Li-Hsin ID: 9000401672803

    Articles in CiNii:1

    • Characterization of ZnSe/GaAs(001) Heteroepitaxial Interfaces by X-Ray Reflectivity Measurement (1998)
  • Kuo Li-Hsin ID: 9000401711212

    Articles in CiNii:1

    • Oxygen and Hydrogen Implanted Oxidation Enhancement of Al0.98Ga0.02As/Al0.7Ga0.3As Distributed Bragg Reflector Structure (2002)
  • Kuo Li-hsin ID: 9000003382763

    JRCAT-AIST (2001 from CiNii)

    Articles in CiNii:10

    • Characterization and Control of ZnSe/GaAs Hetrovalent Interface (1997)
    • Precise measurement of surface layers of ZnSe/GaAs using X-ray asymmetric Bragg diffraction (1996)
    • Layer-by-layer growth of In_xGa_<1-x>As on GaAs(001) (2001)
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