Search Results1-20 of  60

  • 1 / 3
  • KAGOSHIMA Yasushi ID: 9000000027742

    高エネルギー物理学研究所 (1997 from CiNii)

    Articles in CiNii:1

    • Inner-shell Electron Excitation Effect on the Structural Change in Gallium Arsenide with X-rays (1997)
  • KAGOSHIMA Yasushi ID: 9000000045668

    Faculty of Science, Himeji Institute of Technology (1997 from CiNii)

    Articles in CiNii:1

    • Present Status of the Fresnel Zone Plate and Its Applications (1997)
  • KAGOSHIMA Yasushi ID: 9000000952206

    姫路工業大学大学院理学研究科 (2004 from CiNii)

    Articles in CiNii:4

    • 第7回X線顕微鏡国際会議XRM2002に参加して (2002)
    • Production of High-Performance X-Ray Microbeam and Its Applications to X-Ray Microscopy (2004)
    • X-ray Microscopes (2002)
  • KAGOSHIMA Yasushi ID: 9000001529529

    Graduate School of Material Science, University of Hyogo (2007 from CiNii)

    Articles in CiNii:2

    • 第8回X線顕微鏡国際会議報告 (2005)
    • Hard X-ray nano-interferometer and its application to high-spatial-resolution phase tomography (2007)
  • KAGOSHIMA Yasushi ID: 9000010453492

    Articles in CiNii:1

    • Strain Analysis of Silicon Nanolayers by Grazing Incidence X-ray Diffraction (2007)
  • KAGOSHIMA Yasushi ID: 9000020706671

    Institute of Applied Physics, University of Tsukuba (1988 from CiNii)

    Articles in CiNii:1

    • Synchrotron radiation soft X-ray microscopy. (1988)
  • KAGOSHIMA Yasushi ID: 9000107363453

    Graduate School of Material Science, University of Hyogo (2005 from CiNii)

    Articles in CiNii:1

    • Real-Time Observation of Fractional-Order X-ray Reflection Profiles of InP(001) During Step-Flow Growth (2005)
  • KAGOSHIMA Yasushi ID: 9000107382451

    Graduate School and Faculty of Science, Himeji Institute of Technology (2004 from CiNii)

    Articles in CiNii:1

    • High-Spatial-Resolution Phase Measurement by Micro-Interferometry Using a Hard X-Ray Imaging Microscope (2004)
  • KAGOSHIMA Yasushi ID: 9000253696701

    Faculty of Science, Himeji Institute of Technology (1997 from CiNii)

    Articles in CiNii:1

    • Soft X-Ray Optics. Present Status of the Fresnel Zone Plate and Its Applications. (1997)
  • KAGOSHIMA Yasushi ID: 9000255829241

    Department of Material Science, Graduate School and Faculty of Science, Himeji Institute of Technology (2002 from CiNii)

    Articles in CiNii:1

    • New Trends in X-Ray Source and X-Ray Imaging Technologies. X-Ray Microscopes. (2002)
  • KAGOSHIMA Yasushi ID: 9000256431559

    Faculty of Science, Himeji Institute of Technology (2001 from CiNii)

    Articles in CiNii:1

    • Radiation and Photography. X-Ray Refraction Contrast Imaging. (2001)
  • KAGOSHIMA Yasushi ID: 9000257983270

    University of Hyogo (2007 from CiNii)

    Articles in CiNii:1

    • Strain Analysis of Silicon Nanolayers by Grazing Incidence X-ray Diffraction (2007)
  • KAGOSHIMA Yasushi ID: 9000261052167

    兵庫県立大学大学院物質理学研究科 (2013 from CiNii)

    Articles in CiNii:1

    • Current Status and Future Challenges for Fresnel Zone Plate Type X-Ray Focusing Devices (2013)
  • KAGOSHIMA Yasushi ID: 9000404507663

    Graduate School of Science, Himeji Institute of Technology (2003 from CiNii)

    Articles in CiNii:1

    • Detection of minute strain in very local areas of materials by using an X−ray microbeam (2003)
  • Kagoshima Yasushi ID: 9000003263139

    Graduate School of Material Science, University of Hyogo (2010 from CiNii)

    Articles in CiNii:18

    • Scanning Differential-Phase-Contrast Hard X-Ray Microscopy with Wedge Absorber Detector (2004)
    • Hard X-Ray Nano-Interferometer and Its Application to High-Spatial-Resolution Phase Tomography (2006)
    • Sub-15nm Hard X-Ray Focusing with a New Total-Reflection Zone Plate (2010)
  • Kagoshima Yasushi ID: 9000024983653

    Articles in CiNii:1

    • Tandem-phase zone-plate optics for high-energy x-ray focusing (2011)
  • Kagoshima Yasushi ID: 9000060042483

    Articles in CiNii:1

    • Crystallinity Investigation of Compositionally Graded SiGe Layers by Synchrotron X-ray Cross-Sectional Diffraction (2008)
  • Kagoshima Yasushi ID: 9000073921740

    Articles in CiNii:1

    • Development of a Total Reflection Zone Plate for Hard X-ray Focusing (2010)
  • Kagoshima Yasushi ID: 9000082753692

    Articles in CiNii:1

    • Two-Dimensional Anisotropic Lattice Deformation Observed in a Commercially Available Strained-Si Wafer (2006)
  • Kagoshima Yasushi ID: 9000252964995

    Articles in CiNii:1

    • Shadow-Projection X-Ray Microtomography for Line-Like Objects (1988)
  • 1 / 3
Page Top