Search Results1-20 of  55

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  • Kamei Masayuki ID: 9000024971303

    Articles in CiNii:1

    • Analytic model of threshold voltage variation induced by plasma charging damage in high-k metal-oxide-semiconductor field-effect transistor (Special issue: Dielectric thin films for future electron devices: science and technology) (2011)
  • Kamei Masayuki ID: 9000025015285

    Articles in CiNii:1

    • Comparative study of plasma-charging damage in high-k dielectric and p-n junction and their effects on off-state leakage current of metal-oxide-semiconductor field-effect transistors (Special issue: Dry process) (2011)
  • Kamei Masayuki ID: 9000025032404

    Articles in CiNii:1

    • Usefulness of substrate cleaning with carbon dioxide for organic electronic devices (2007)
  • Kamei Masayuki ID: 9000025037971

    Articles in CiNii:1

    • Comparative study of plasma source-dependent charging polarity in metal-oxide-semiconductor field effect transistors with high-k and SiO2 gate dielectrics (Special issue: Solid state devices and materials) (2008)
  • Kamei Masayuki ID: 9000356688930

    Articles in CiNii:1

    • Phenotypic abnormalities of fr, sp, and och-1 single mutants are suppressed by loss of putative GPI-phospholipase A2 in Neurospora crassa (2017)
  • KAMEI Masayuki ID: 9000000888232

    Department of Orthopaedic Surgery, Kyoto Katsura Hospital (1999 from CiNii)

    Articles in CiNii:6

    • Postoperative result of drop foot associated with lumbar disorders in the eldery patients (1999)
    • Studies on poor results of surgical treatment for lumbar canal stenosis (1995)
    • A follow-up study of high tibial osteotomy of the knee in the elderly (1997)
  • KAMEI Masayuki ID: 9000002175975

    Graduate School of Engineering, Kyoto University (2007 from CiNii)

    Articles in CiNii:2

    • Quantitative Characterization of Plasma-Induced Defect Generation Process in Exposed Thin Si Surface Layers (2007)
    • A Comparative Study of Plasma Source-Dependent Charging Polarity in MOSFETs with High-k and SiO_2 Gate Dielectrics (2007)
  • KAMEI Masayuki ID: 9000003410395

    Articles in CiNii:16

    • Characteristics of Sputter-Deposited Tin-Doped Indium Oxide Films (1998)
    • Studies on Structure and Growth of Ce Thin Films (1996)
    • 格子歪に誘起されたアナターゼ型光触媒二酸化チタン単結晶中の電荷分離 (特集 NIMSナノセラミックスセンター:多機能性イノベイティブセラミックスの創製) (2007)
  • KAMEI Masayuki ID: 9000005548790

    Nano Ceramics Center, National Institute for Materials Science (2008 from CiNii)

    Articles in CiNii:12

    • Comparative Study of TiO_2 Anatase Epitaxial Thin Films Grown by Magnetron Sputtering and Metalorganic Chemical Vapor Deposition (2003)
    • Localization of the Photocatalytic Reaction on the Grain Boundary of Bicrystalline TiO_2 (2008)
    • Two Dimensional Structure and Growth Mode of Ultrathin Ce Film on a Mo(110) Surface (1995)
  • KAMEI Masayuki ID: 9000021597585

    Articles in CiNii:1

    • In-situ Chemical Analysis of Oxide Superconducting Films by Total-Reflection-Angle X-ray Spectroscopy (1998)
  • KAMEI Masayuki ID: 9000107336405

    Advanced Materials Laboratory (AML), National Institute for Materials Science (NIMS) (2004 from CiNii)

    Articles in CiNii:1

    • Photocatalytic Property and Deep Levels of Nb-doped Anatase TiO_2 Film Grown by Metalorganic Chemical Vapor Depostion (2004)
  • KAMEI Masayuki ID: 9000253648938

    Department of Materials Science and Technology, Science University of Tokyo (1996 from CiNii)

    Articles in CiNii:1

    • Studies on Structure and Growth of Ce Thin Films on a Mo(110) Surface. (1996)
  • KAMEI Masayuki ID: 9000255707364

    Laboratory of Environmental Chemistry, College of Engineering, University of Osaka Prefecture (1987 from CiNii)

    Articles in CiNii:1

    • Automatic control of continuous wastewater-treatment process for simultaneous removal of hazardous metals with hypochlorite and iron(II). (1987)
  • KAMEI Masayuki ID: 9000259594948

    Kyoto University (2013 from CiNii)

    Articles in CiNii:1

    • Effect of plasma-induced charging damage on random telegraph noise (RTN) behaviors in advanced MOSFETs (2013)
  • KAMEI Masayuki ID: 9000391846294

    National Institute for Materials Scinece, JAPAN (2003 from CiNii)

    Articles in CiNii:1

    • Synthesis and Characterization of Single Junction Low Voltage Varistors Composed of ZnO Single Crystals and Novel Intafacial Glass Phase (2003)
  • Kamei Masayuki ID: 9000077948309

    Articles in CiNii:1

    • Quantitative Characterization of Plasma-Induced Defect Generation Process in Exposed Thin Si Surface Layers (2008)
  • Kamei Masayuki ID: 9000243854348

    Articles in CiNii:5

    • Detection and monitoring of fungicide resistance in plant pathogens using pyrosequencing (2016)
    • 3A01 Effect of cell wall synthesis inhibitor micafungin on three MAP kianases activity in Neurospora crassa. (2010)
    • 3A02 Sensitivity to QoI fungicide and induction of alternative oxidase in the MFS transporter ant-1 strain of Neurospora crassa. (2010)
  • Kamei Masayuki ID: 9000252978440

    Superconductivity Resarch Laboratory, ISTEC (1991 from CiNii)

    Articles in CiNii:1

    • X-Ray Chemical Analysis of an YBa<SUB>2</SUB>Cu<SUB>3</SUB>O<I><SUB>x</SUB></I> Thin Film by Scanning Electron Microscopy and Total-Reflection-Angle X-Ray Spectroscopy (SEM-TRAXS) (1991)
  • Kamei Masayuki ID: 9000252980110

    Superconductivity Resarch Laboratory, ISTEC (1991 from CiNii)

    Articles in CiNii:1

    • Novel Chemical Analysis for Thin Films: Scanning Electron Microscopy & Total-Reflection-Angle X-Ray Spectroscopy (SEM-TRAXS)—X-Ray Take-Off Angle Effect (1991)
  • Kamei Masayuki ID: 9000252981660

    Superconductivity Research Laboratory, ISTEC (1992 from CiNii)

    Articles in CiNii:1

    • <I>In Situ</I> X-Ray Chemical Analysis of Y<SUB>1</SUB>Ba<SUB>2</SUB>Cu<SUB>3</SUB>O<SUB>7−<I>x</I></SUB> Films by Reflection-High-Energy-Electron-Diffraction Total-Reflection-Angle X-Ray Spectroscopy (1992)
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