Search Results1-3 of  3

  • KANG Keun-Koo ID: 9000006459526

    Department of Physics, Chungbuk Nataional University (2002 from CiNii)

    Articles in CiNii:2

    • Characterization of the Co-Silicide Penetration Depth into the Junction Area (2001)
    • Characterization of the Co-Silicide Penetration Depth into the Junction Area for 0.15 and Sub-0.15 Micron CMOS Technology (2002)
  • Kang Keun-Koo ID: 9000258161359

    Department of Physics, Chungbuk Nataional University, Hungduk-Gu, Chongju, Choongbuk, 361-725, Korea (2002 from CiNii)

    Articles in CiNii:1

    • Characterization of the Co-Silicide Penetration Depth into the Junction Area for 0.15 and Sub-0.15 Micron CMOS Technology. (2002)
  • Kang Keun-Koo ID: 9000401706100

    Articles in CiNii:1

    • Characterization of the Co-Silicide Penetration Depth into the Junction Area for 0.15 and Sub-0.15 Micron CMOS Technology (2002)
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