Search Results1-20 of  440

  • Kawai Akira ID: 9000007447243

    Articles in CiNii:1

    • Microbiological Studies on Nitrogen Cycle in Aquatic Environments-3-Metabolic Rate of Ammonium Nitrogen in Aerated Fish Culture Ponds (1977)
  • Kawai Akira ID: 9000007447252

    Articles in CiNii:1

    • Microbiolgical Studies on Nitrogen Cycle in Aquatic Environments-2-Fundamental Examination for the Mass Spectrometry Used in 15N Tracer Method (1976)
  • Kawai Akira ID: 9000008782336

    Articles in CiNii:1

    • Studies on the Release of Ammonium Nitrogen from the Bottom Sediments in Freshwater Bodies-1-A preliminary experiment using an annular channel (1976)
  • Kawai Akira ID: 9000009566005

    Articles in CiNii:1

    • Adhesion and Cohesion Analysis of ArF/SOR Resist Patterns with Microtip of Atomic Force Microscope(AFM) (2001)
  • Kawai Akira ID: 9000009872345

    Articles in CiNii:1

    • Interaction Force Analysis of Resist Film Surface in Water Vapor (2004)
  • Kawai Akira ID: 9000009872349

    Articles in CiNii:1

    • Meniscus Analysis in Micro Gap during Liquid Drying Process (2004)
  • Kawai Akira ID: 9000010004029

    Articles in CiNii:1

    • Condensation Behavior of Nanoscale Bubbles on ArF Excimer Resist Surface Analyzed by Atomic Force Microscope (2005)
  • Kawai Akira ID: 9000010004037

    Articles in CiNii:1

    • Interaction Analysis of DI-water/Air/ArF Resist System using Atomic Force Microscope (2005)
  • Kawai Akira ID: 9000010100024

    Articles in CiNii:1

    • Nanoscale Characterization in Resist Processing by using Atomic Force Microscope (2005)
  • Kawai Akira ID: 9000010177907

    Articles in CiNii:1

    • Topcoat Characterization for Immersion Lithography by Fluoric Acid Etching on Silicon Substrate (2006)
  • Kawai Akira ID: 9000010400667

    Articles in CiNii:1

    • Bubbles condensed at water/resist interface analyzed by AFM (2007)
  • Kawai Akira ID: 9000010454562

    Articles in CiNii:1

    • Non-contacting deformation (NCD) of line resist pattern due to interaction force with AFM tip (2007)
  • Kawai Akira ID: 9000010553108

    Articles in CiNii:1

    • Micro channel device composed by dry film resist (2008)
  • Kawai Akira ID: 9000010553119

    Articles in CiNii:1

    • Flowing control of micro bubbles in DFR micro fluidic channel formed on metal/insulator composite substrate (2008)
  • Kawai Akira ID: 9000010553125

    Articles in CiNii:1

    • Adsorption of micro tip on various surface energy substrates (2008)
  • Kawai Akira ID: 9000010553129

    Articles in CiNii:1

    • Non-contacting deformation of resist micro pattern due to van der Waals interaction (2008)
  • Kawai Akira ID: 9000010734581

    Articles in CiNii:1

    • Formation mechanism of micro defect in anisotropic etching analyzed by using quasi-defect pattern (2009)
  • Kawai Akira ID: 9000010734583

    Articles in CiNii:1

    • Dielectric dispersion analysis of resist layer (2009)
  • Kawai Akira ID: 9000010734701

    Articles in CiNii:1

    • Characteristics of photomask substrate in optical lithography (2009)
  • Kawai Akira ID: 9000010734703

    Articles in CiNii:1

    • Analysis of self-standing structure composed by thick resist layer (2009)
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