Search Results1-20 of  28

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  • KODZASA Takehito ID: 9000001506994

    National Institute of Advanced Industrial Science and Technology (2001 from CiNii)

    Articles in CiNii:1

    • Observation of Photoassisted Electroluminescent Emission Enhanced by Near-Infrared Irradiation (2001)
  • KODZASA Takehito ID: 9000107341688

    National Institute of Advanced Industrial Science and Technology (2005 from CiNii)

    Articles in CiNii:1

    • Electrode Effects of Organic Thin-Film Transistor with Top and Bottom Contact Configuration (2005)
  • KODZASA Takehito ID: 9000257982637

    National Institute of Advanced Industrial Science and Technology (2003 from CiNii)

    Articles in CiNii:1

    • Effect of Interfacial Structure on Organic Field Effect Transistor. (2003)
  • KODZASA Takehito ID: 9000258233800

    Photonics Research Institute, AIST (2009 from CiNii)

    Articles in CiNii:1

    • Development of flexible-printable device processing technology:— For achievement of prosumer electronics — (2009)
  • KODZASA Takehito ID: 9000283623986

    産業技術総合研究所 光技術研究部門 (2008 from CiNii)

    Articles in CiNii:1

    • フレキシブルプリンタブルデバイス製造技術の開発―「どこでもデバイス,だれでもデバイス」の実現に向けて―:-「どこでもデバイス、だれでもデバイス」の実現に向けて- (2008)
  • Kodzasa Takehito ID: 9000257896229

    Photonics Research Institute, National Institute of Advanced Industrial Science and Technology (AIST) (2004 from CiNii)

    Articles in CiNii:1

    • Device Characteristics of Polythiophene-based Field-effect Transistors Fabricated under Various Conditions (2004)
  • Kodzasa Takehito ID: 9000258182870

    National Institute of Advanced Industrial Science and Technology (2005 from CiNii)

    Articles in CiNii:1

    • Electrode Effects of Organic Thin-Film Transistor with Top and Bottom Contact Configuration (2005)
  • Kodzasa Takehito ID: 9000261654239

    Flexible Electronics Research center (FLEC), National Institute of Advanced Industrial Science and Technology (2014 from CiNii)

    Articles in CiNii:1

    • Effect of Microwave Annealing on Oxide-Semiconductor-Precursor Ink (2014)
  • Kodzasa Takehito ID: 9000261654246

    Flexible Electronics Research Center, National Institute of Advanced Industrial Science and Technology (AIST) (2014 from CiNii)

    Articles in CiNii:1

    • Effect of Dielectric Behavior of Gate Dielectric Polymers on Memory Characteristics of Organic Field-effect Transistors (2014)
  • Kodzasa Takehito ID: 9000283739841

    AIST (2007 from CiNii)

    Articles in CiNii:1

    • Development of high performance SiO2 Insulator thin film fabricated by low-temperature printing process (2007)
  • Kodzasa Takehito ID: 9000347143437

    National Institute of Advanced Industrial Science and Technology (2009 from CiNii)

    Articles in CiNii:1

    • Development of low-temperature fabrication technique for printing metal patterns (2009)
  • Kodzasa Takehito ID: 9000347143535

    AIST (2009 from CiNii)

    Articles in CiNii:1

    • Preparation of nano-composite passivation film by printing process at low temperature (2009)
  • Kodzasa Takehito ID: 9000347143971

    AIST (2010 from CiNii)

    Articles in CiNii:1

    • Development of alloying technique for printed metal pattern (2010)
  • Kodzasa Takehito ID: 9000347144274

    AIST (2011 from CiNii)

    Articles in CiNii:1

    • Workfunction control of metal electrode for printed device (2011)
  • Kodzasa Takehito ID: 9000401564749

    Articles in CiNii:1

    • 2008-05-23 (2008)
  • Kodzasa Takehito ID: 9000401737432

    Articles in CiNii:1

    • Electrode Effects of Organic Thin-Film Transistor with Top and Bottom Contact Configuration (2005)
  • Kodzasa Takehito ID: 9000401766508

    Articles in CiNii:1

    • Effect of Built-in Potential under Drain Electrodes on Threshold Voltage of Organic Field-Effect Transistors (2007)
  • Kodzasa Takehito ID: 9000401787280

    Articles in CiNii:1

    • Development of Field-Effect Transistor-Type Photorewritable Memory Using Photochromic Interface Layer (2010)
  • Kodzasa Takehito ID: 9000401796469

    Articles in CiNii:1

    • Printed Electrode for All-Printed Polymer Diode (2011)
  • Kodzasa Takehito ID: 9000401799616

    Articles in CiNii:1

    • Transient Drain Current Measurement for Polymer Transistor Containing Residual Bromine Atoms (2011)
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