Search Results1-8 of  8

  • KUMANOYA Masaki ID: 9000004752975

    ULSI Development Center, Mitsubishi Electric Corporation (1998 from CiNii)

    Articles in CiNii:14

    • ASIC Memory (1993)
    • Memory Trend of Computer Systems (1996)
    • A Delay-Locked Loop and 90-degree Phase Shifter for 800Mbps Double Data Rate Memories (1998)
  • KUMANOYA Masaki ID: 9000004813227

    the ULSI Laboratory, Mitsubishi Electric Corp. (1996 from CiNii)

    Articles in CiNii:2

    • A 90-MHz 16-Mb System Integrated Memory with Direct Interface to CPU (1996)
    • Trends in High-Speed DRAM Architectures (1996)
  • KUMANOYA Masaki ID: 9000005731054

    LSI Research and Development Laboratory (1983 from CiNii)

    Articles in CiNii:2

    • Hot-Electron Trapping Effects of Short Channel 64 K Dynamic MOS RAM : A-2: LSI-1 (1983)
    • Diffusion Length Measurement Using Dynamic MOS RAM : A-3: LSI-2 (1983)
  • KUMANOYA Masaki ID: 9000253321191

    Department of Engineering, Faculty of Engineering, Nagoya University (1978 from CiNii)

    Articles in CiNii:1

    • Amorphous/Crystalline Pb<sub>1-<i>x</i></sub>Sn<i>x</i>Te Heterojunction (1978)
  • KUMANOYA Masaki ID: 9000253321196

    Department of Electrical Engineering, Faculty of Engineering, Nagoya University (1978 from CiNii)

    Articles in CiNii:1

    • Spectral Responses of Impurity Diffused PbSnTe Infrared Detectors (1978)
  • Kumanoya Masaki ID: 9000004873055

    the ULSI Laboratory, Mitsubishi Electric Corporation (1994 from CiNii)

    Articles in CiNii:1

    • A 180 MHz Multiple-Registered 16 Mbit SDRAM with Flexible Timing Scheme (Special Section on High Speed and High Density Multi Functional LSI Memories) (1994)
  • Kumanoya Masaki ID: 9000402057097

    Articles in CiNii:1

    • Hot-Electron Trapping Effects of Short Channel 64 K Dynamic MOS RAM (1983)
  • Kumanoya Masaki ID: 9000402057177

    Articles in CiNii:1

    • Diffusion Length Measurement Using Dynamic MOS RAM (1983)
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