Search Results1-11 of  11

  • KURACHI Ikuo ID: 9000004874937

    LSI Production Division, OKI Electric Industry Co., Ltd. (1999 from CiNii)

    Articles in CiNii:1

    • Advanced Characterization Method for Sub-Micron DRAM Cell Transistors (1999)
  • Kurachi Ikuo ID: 9000398020156

    Articles in CiNii:1

    • A Silicon-on-Insulator-Based Dual-Gain Charge-Sensitive Pixel Detector for Low-Noise X-ray Imaging for Future Astronomical Satellite Missions (2018)
  • Kurachi Ikuo ID: 9000402020926

    Articles in CiNii:1

    • Enhancement and retardation of thermal boron diffusion in silicon from atmospheric pressure chemical vapor deposited boron silicate glass film (2014)
  • Kurachi Ikuo ID: 9000402031160

    Articles in CiNii:1

    • Study of oxide-silicon interface state generation and annihilation by rapid thermal processing (2015)
  • Kurachi Ikuo ID: 9000402032014

    Articles in CiNii:1

    • Analytical boron diffusivity model in silicon for thermal diffusion from boron silicate glass film (2015)
  • Kurachi Ikuo ID: 9000402474543

    KEK IPNS (2018 from CiNii)

    Articles in CiNii:1

    • Design and evaluation of teach through APD array using Silicon on insulator technology (2018)
  • Kurachi Ikuo ID: 9000402475057

    KEK IPNS (2018 from CiNii)

    Articles in CiNii:1

    • Development of integration-type SOI radiation pixel sensor (2018)
  • Kurachi Ikuo ID: 9000402479426

    KEK (2018 from CiNii)

    Articles in CiNii:1

    • Proton Damage Experiment and Investigation of Degradation Mechanism of XRPIX (2018)
  • Kurachi Ikuo ID: 9000404802752

    KEK (2018 from CiNii)

    Articles in CiNii:1

    • Development of SOI pixel sensor SOFIST for the ILC vertex detector. (2018)
  • Kurachi Ikuo ID: 9000408856870

    Articles in CiNii:1

    • 宇宙背景ニュートリノ崩壊探索 COBAND 実験 (2019)
  • Kurachi Ikuo ID: 9000408857346

    Articles in CiNii:1

    • 宇宙背景ニュートリノ崩壊探索COBAND実験 (2018)
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