Search Results1-20 of  21

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  • Kurouchi Masahito ID: 9000378065797

    Articles in CiNii:1

    • Ni-W Moth-Eye Structures Processing with Pulse Plating (電子材料研究会 フレキシブルセラミックスコーティング研究会) (2017)
  • KUROUCHI Masahito ID: 9000006915550

    Quantum Engineering, Graduate School of Engineering, Nagoya University (2008 from CiNii)

    Articles in CiNii:3

    • Normally-off mode AlGaN/GaN HEMTs with p-InGaN Cap Layer (2008)
    • Normally-off mode AlGaN/GaN HEMTs with p-InGaN Cap Layer (2008)
    • Normally-off mode AlGaN/GaN HEMTs with p-InGaN Cap Layer (2008)
  • KUROUCHI Masahito ID: 9000014188915

    R&D Association for Future Electron Devices (2008 from CiNii)

    Articles in CiNii:1

    • Effects of Traps Formed by Threading Dislocations on Off-State Breakdown Characteristics in GaN Buffer Layer in AlGaN/GaN Heterostructure Field-Effect Transistors (2008)
  • KUROUCHI Masahito ID: 9000107363436

    Department of Photonics, Faculty of Science and Engineering, Ritsumeikan University (2005 from CiNii)

    Articles in CiNii:1

    • Fabrication and Characterization of InN-Based Quantum Well Structures Grown by Radio-Frequency Plasma-Assisted Molecular-Beam Epitaxy (2005)
  • KUROUCHI Masahito ID: 9000304691713

    神奈川県産業技術センター (2014 from CiNii)

    Articles in CiNii:1

    • J2220101 Study of miniaturization of Ni-W patterns on Ni-W electroformed mold for glass imprint (2014)
  • KUROUCHI Masahito ID: 9000304766266

    Department of Photonics, Faculty of Science and Engineering, Ritsumeikan University (2005 from CiNii)

    Articles in CiNii:15

    • Dependence of Optical Properties of InN on Its Crystalline Quality (2005)
    • Dependence of Optical Properties of InN on Its Crystalline Quality (2005)
    • Dependence of Optical Properties of InN on Its Crystalline Quality (2005)
  • KUROUCHI Masahito ID: 9000330669393

    神奈川県産業技術センター (2015 from CiNii)

    Articles in CiNii:1

    • J2220205 Effects of Metallic Ion Concentration on Flatness of Ni-W film (2015)
  • KUROUCHI Masahito ID: 9000330755653

    神奈川県産業技術センター (2015 from CiNii)

    Articles in CiNii:1

    • 511 Study of Composition and Crystal structure of Ni-W film for Mold material of Thermal Imprint (2015)
  • KUROUCHI Masahito ID: 9000390425753

    Kanagawa Institute of Industrial Science and Technology (2018 from CiNii)

    Articles in CiNii:1

    • Removal of SU8 fine patterns with N-Methyl-2-Pyrrolidone doped (2018)
  • KUROUCHI Masahito ID: 9000392162819

    神奈川県産業技術センター (2016 from CiNii)

    Articles in CiNii:1

    • Effects of Metallic Concentration in Plating Solution on Ni-W Film for Imprinting Mold (2016)
  • KUROUCHI Masahito ID: 9000396163091

    Kanagawa Institute of Industrial Science and Technology (2018 from CiNii)

    Articles in CiNii:1

    • Removal of SU8 fine patterns with N-Methyl-2-Pyrrolidone doped (2018)
  • KUROUCHI Masahito ID: 9000402075991

    Kanagawa Institute of Industrial Science and Technology (2018 from CiNii)

    Articles in CiNii:1

    • The Time Dependency of Nano Hole Form for Al Nanoimprinting (2018)
  • Kurouchi Masahito ID: 9000390888841

    KISTEC (2017 from CiNii)

    Articles in CiNii:1

    • Removal of SU8 with N-Methyl-2-Pyrrolidone doped (2017)
  • Kurouchi Masahito ID: 9000401563846

    Articles in CiNii:1

    • Effects of Traps Formed by Threading Dislocations on Off-State Breakdown Characteristics in GaN Buffer Layer in AlGaN/GaN Heterostructure Field-Effect Transistors (2007)
  • Kurouchi Masahito ID: 9000401743970

    Articles in CiNii:1

    • Fabrication and Characterization of InN-Based Quantum Well Structures Grown by Radio-Frequency Plasma-Assisted Molecular-Beam Epitaxy (2005)
  • Kurouchi Masahito ID: 9000401977195

    Articles in CiNii:1

    • Constriction of a lattice constant in an epitaxial magnesium oxide film deposited on a silicon substrate (2018)
  • Kurouchi Masahito ID: 9000402026770

    Articles in CiNii:1

    • Expansion of lattice constants of aluminum nitride thin film prepared on sapphire substrate by ECR plasma sputtering method (2014)
  • Kurouchi Masahito ID: 9000402026862

    Articles in CiNii:1

    • Effects of post exposure bake temperature and exposure time on SU-8 nanopattern obtained by electron beam lithography (2014)
  • Kurouchi Masahito ID: 9000402033170

    Articles in CiNii:1

    • 2015-12-17 (2015)
  • Kurouchi Masahito ID: 9000402040206

    Articles in CiNii:1

    • 2016-12-02 (2016)
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