Search Results1-20 of  23

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  • Kwon Jang Yeon ID: 9000024993721

    Articles in CiNii:1

    • Developing display screens with oxidized TFT (2008)
  • KWON Jang Yeon ID: 9000006731789

    Sumsung Advanced Institute of Technology (2008 from CiNii)

    Articles in CiNii:1

    • Degradation of Ga_2O_3-In_2O_3-ZnO (GIZO) Thin Film Transistor (2008)
  • KWON Jang Yeon ID: 9000014432447

    Samsung Advanced Institute of Technology (SAIT) (2006 from CiNii)

    Articles in CiNii:6

    • Low temperature poly-Si thin film transistor on plastic substrates (2004)
    • Low Temperature Poly-Si Thin Film Transistor on Plastic Substrates(Thin Film Transistors, <Special Section>Fundamental and Application of Advanced Semiconductor Devices) (2005)
    • Oxygen Effect on Laser Crystallization of Sputtered a-Si Film on Plastic Substrate (2006)
  • KWON Jang Yeon ID: 9000016493774

    Samsung Advanced Institute of Technology (2006 from CiNii)

    Articles in CiNii:1

    • Excimer Laser Annealing of PbZr_<0.4>Ti_<0.6>O_3 Thin Film at Low Temperature (2006)
  • KWON Jang Yeon ID: 9000107313940

    Sumsung Advanced Institute of Technology (2007 from CiNii)

    Articles in CiNii:1

    • Reliability Analysis of Ultra Low-Temperature Polycrystalline Silicon Thin-Film Transistors (2007)
  • KWON Jang Yeon ID: 9000107384340

    Articles in CiNii:1

    • Degradation of Ga_2O_3-In_2O_3-ZnO (GIZO) Thin Film Transistor (2008)
  • KWON Jang-Yeon ID: 9000001814361

    Samsung Advanced Institute of Technology (SAIT) (2006 from CiNii)

    Articles in CiNii:1

    • Amorphous Silicon Film Deposition by Low Temperature Catalytic Chemical Vapor Deposition (<150℃) and Laser Crystallization for Polycrystalline Silicon Thin-Film Transistor Application (2006)
  • KWON Jang-Yeon ID: 9000006481920

    School of Materials Science and Engineering, Seoul National University (2002 from CiNii)

    Articles in CiNii:1

    • Simulation of the Copper Diffusion Profile in SiO_2 during Bias Temperature Stress (BTS) Test (2002)
  • Kwon Jang Yeon ID: 9000025123488

    Articles in CiNii:1

    • Low-Temperature Process for Advanced Si Thin Film Transistor Technology (Special Issue: Active-Matrix Liquid-Crystal Displays--TFT Technologies and Related Materials) (2006)
  • Kwon Jang Yeon ID: 9000025123490

    Articles in CiNii:1

    • A New Approach of Polycrystalline Silicon Film on Plastic Substrate Prepared by Ion Beam Deposition Followed by Excimer Lasaer Crystallization at Room Temperature (Special Issue: Active-Matrix Liquid-Crystal Displays--TFT Technologies and Related Materials) (2006)
  • Kwon Jang Yeon ID: 9000401756221

    Articles in CiNii:1

    • Oxygen Effect on Laser Crystallization of Sputtered a-Si Film on Plastic Substrate (2006)
  • Kwon Jang Yeon ID: 9000401772989

    Articles in CiNii:1

    • 2008-08-08 (2008)
  • Kwon Jang Yeon ID: 9000401778622

    Articles in CiNii:1

    • 2009-04-20 (2009)
  • Kwon Jang-Yeon ID: 9000401713824

    Articles in CiNii:1

    • Simulation of the Copper Diffusion Profile in SiO2 during Bias Temperature Stress (BTS) Test (2002)
  • Kwon Jang-Yeon ID: 9000401755343

    Articles in CiNii:1

    • Amorphous Silicon Film Deposition by Low Temperature Catalytic Chemical Vapor Deposition (<150 °C) and Laser Crystallization for Polycrystalline Silicon Thin-Film Transistor Application (2006)
  • Kwon Jang-Yeon ID: 9000401755770

    Articles in CiNii:1

    • Erratum: "Amorphous Silicon Film Deposition by Low Temperature Catalytic Chemical Vapor Deposition (<150 °C) and Laser Crystallization for Polycrystalline Silicon Thin-Film Transistor Application" (2006)
  • Kwon Jang-Yeon ID: 9000401765033

    Articles in CiNii:1

    • Gate Insulator Inhomogeneity in Thin Film Transistors Having a Polycrystalline Silicon Layer Prepared Directly by Catalytic Chemical Vapor Deposition at a Low Temperature (2007)
  • Kwon Jang-Yeon ID: 9000401794597

    Articles in CiNii:1

    • 2011-02-21 (2011)
  • Kwon Jang-Yeon ID: 9000401800521

    Articles in CiNii:1

    • Thin Film Transistor Using Amorphous InGaZnO Films as Both Channel and Source/Drain Electrodes (2011)
  • Kwon Jang-Yeon ID: 9000401806059

    Articles in CiNii:1

    • Effects of Annealing Temperature on Electrical Characteristics of Solution-Processed Zinc Tin Oxide Thin-Film Transistors (2012)
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