Search Results41-60 of  66

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  • Lee Hi-Deok ID: 9000401795913

    Articles in CiNii:1

    • 2011-04-20 (2011)
  • Lee Hi-Deok ID: 9000401801570

    Articles in CiNii:1

    • 2011-10-20 (2011)
  • Lee Hi-Deok ID: 9000401801588

    Articles in CiNii:1

    • 2011-10-20 (2011)
  • Lee Hi-Deok ID: 9000401801611

    Articles in CiNii:1

    • 2011-10-20 (2011)
  • Lee Hi-Deok ID: 9000401802429

    Articles in CiNii:1

    • 2011-11-28 (2011)
  • Lee Hi-Deok ID: 9000401803633

    Articles in CiNii:1

    • 2012-02-20 (2012)
  • Lee Hi-Deok ID: 9000401809127

    Articles in CiNii:1

    • Electrical Characteristic Analysis of Postannealed ZnO Thin-Film Transistors under O$_{2}$ Ambient (2012)
  • Lee Hi-Deok ID: 9000401809134

    Articles in CiNii:1

    • Electrical Instabilities in Amorphous InGaZnO Thin Film Transistors with Si$_{3}$N$_{4}$ and Si$_{3}$N$_{4}$/Al$_{2}$O$_{3}$ Gate Dielectrics (2012)
  • Lee Hi-Deok ID: 9000401980505

    Articles in CiNii:1

    • 2017-02-28 (2017)
  • Lee Hi-Deok ID: 9000401996788

    Articles in CiNii:1

    • 2011-04-01 (2011)
  • Lee Hi-Deok ID: 9000402002434

    Articles in CiNii:1

    • 2011-10-01 (2011)
  • Lee Hi-Deok ID: 9000402002452

    Articles in CiNii:1

    • 2011-10-01 (2011)
  • Lee Hi-Deok ID: 9000402002475

    Articles in CiNii:1

    • 2011-10-01 (2011)
  • Lee Hi-Deok ID: 9000402003293

    Articles in CiNii:1

    • 2011-12-01 (2011)
  • Lee Hi-Deok ID: 9000402004496

    Articles in CiNii:1

    • 2012-02-01 (2012)
  • Lee Hi-Deok ID: 9000402009986

    Articles in CiNii:1

    • Electrical Characteristic Analysis of Postannealed ZnO Thin-Film Transistors under O2Ambient (2012)
  • Lee Hi-Deok ID: 9000402009993

    Articles in CiNii:1

    • Electrical Instabilities in Amorphous InGaZnO Thin Film Transistors with Si3N4and Si3N4/Al2O3Gate Dielectrics (2012)
  • Lee Hi-Deok ID: 9000402013796

    Articles in CiNii:1

    • Investigation of the Gate Bias Stress Instability in ZnO Thin Film Transistors by Low-Frequency Noise Analysis (2013)
  • Lee Hi-Deok ID: 9000402021919

    Articles in CiNii:1

    • Analysis of stability improvement in ZnO thin film transistor with dual-gate structure under negative bias stress (2014)
  • Lee Hi-Deok ID: 9000402022419

    Articles in CiNii:1

    • Novel silicon surface passivation by Al2O3/ZnO/Al2O3films deposited by thermal atomic layer deposition (2014)
  • 3 / 4
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