Search Results1-20 of  43

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  • LEE Sang In ID: 9000000756425

    Departments of Internal Medicine, Yonsei University College of Medicine (1997 from CiNii)

    Articles in CiNii:1

    • Effect of erythromycin on gastric emptying in healthy individuals assessed by radio-opaque markers and plasma acetaminophen levels (1997)
  • LEE Sang In ID: 9000001505461

    Semiconductor R&D Division,Samsung Electronics Co., Ltd. (2001 from CiNii)

    Articles in CiNii:1

    • Recent Progress in High-k Dielectric Films for ULSIs (2001)
  • LEE Sang In ID: 9000001719104

    Process Development 2, Semiconductor R&D Center, Samsung Electronics (2000 from CiNii)

    Articles in CiNii:1

    • Effects of Step Coverage, Cl Content and Deposition Temperature in TiN Top Electrode on the Reliability of Ta_2O_5 and Al_2O_3 MIS Capacitor for 0.13μm Technology and Beyond (2000)
  • LEE Sang In ID: 9000004965460

    Semiconductor R&D Division, Samsung Electronics Co., Ltd. (2002 from CiNii)

    Articles in CiNii:19

    • Low Damage In Situ Contact Cleaning Method by a Highly Dense and Directional ECR Plasma (1996)
    • Fabrication and Electrical Characterization of Pt/(Ba, Sr)TiO_3/Pt Capacitors for Ultralarge-Scale Integrated Dynamic Random Access Memory Applications (1996)
    • A Process Integration of (Ba, Sr) TiO_3 Capacitor into 256M DRAM (1997)
  • LEE Sang In ID: 9000005599510

    Semiconductor R&D Center, SAWSUNG Electronics Co., Ltd. (1999 from CiNii)

    Articles in CiNii:1

    • Improvement of Photo-Misalignment in Patterned Wafer Bonding Process for Silicon-on-Insulator Device (1999)
  • LEE Sang In ID: 9000005874956

    Process Development Team, semicohductor R&D Center, Samsung Electronicis Company (2000 from CiNii)

    Articles in CiNii:1

    • Influence of La_<0.5>Sr_<0.5>CoO_3 Heterostructure Electrodes on Pb(Zr,Ti)O_3 Thin Film Properties (2000)
  • LEE Sang In ID: 9000017587552

    Articles in CiNii:1

    • Effects of Tegaserod on Ileal Peristalsis of Guinea Pig In Vitro (2004)
  • LEE Sang In ID: 9000107334245

    Semiconductor R&D Center, Samsung Electronics Co., Ltd. (2001 from CiNii)

    Articles in CiNii:1

    • Atomic Layer Deposition - and Chemical Vapor Deposition-TiN Top Electrode Optimization for the Reliability of Ta_2O_5 and Al_2O_3 Metal Insulator Silicon Capacitor for 0.13μm Technology and Beyond (2001)
  • LEE Sang-In ID: 9000005735086

    Semiconductor R & D Center, Samsung Electronics Co., Ltd. (1995 from CiNii)

    Articles in CiNii:1

    • Al-Reflow Process with a "Cap-Clamp" for Sub-Micron Contact Holes (1995)
  • Lee In Sang ID: 9000257699790

    Department of Chemistry, Korea Advanced Institute of Science and Technology (1990 from CiNii)

    Articles in CiNii:1

    • One-pot synthesis of .ALPHA.-chloro ketones from secondary alcohols using N,N-dichloro-p-toluenesulfonamide. (1990)
  • Lee Sang In ID: 9000258131357

    Process Development Team 2, Semiconductor R&D Center, Samsung Electronics Co., Ltd., San #24 Nongseo–Ri, Kiheung–Eup, Kyungki–Do, 449–900, Korea (1996 from CiNii)

    Articles in CiNii:1

    • Low Damage In Situ Contact Cleaning Method by a Highly Dense and Directional ECR Plasma. (1996)
  • Lee Sang In ID: 9000258131498

    SAMSUNG Electronics Co., Semiconductor R&D Center, Memory Process Development Team 2, San #24, Nongseo–lee Kiheung–eup, Yongin–gun, Kyungki–do, 449–900, Korea (1996 from CiNii)

    Articles in CiNii:1

    • Fabrication and Electrical Characterization of Pt/(Ba,Sr)TiO3/Pt Capacitors for Ultralarge-Scale Integrated Dynamic Random Access Memory Applications. (1996)
  • Lee Sang In ID: 9000258134155

    Semiconductor R&D Center, SAMSUNG Electronics Co., San #24, Nongseo–lee, Kiheung–eup, Yongin–si, Kyungki–do, 449–900, Korea (1997 from CiNii)

    Articles in CiNii:1

    • Deposition Characteristics of (Ba, Sr)TiO3 Thin Films by Liquid Source Metal-Organic Chemical Vapor Deposition at Low Substrate Temperatures. (1997)
  • Lee Sang In ID: 9000258135841

    Semiconductor R & D Center, Samsung Electronics Co., Ltd, San #24 Nongseo–Ri, Kiheung–Eup, Yongin–City Kyungki–Do, 449–900, Korea (1997 from CiNii)

    Articles in CiNii:1

    • Effect of SiO2 Film Deposition on the Ferroelectric Properties of a Pt/Pb(Zr,Ti)O3/Pt Capacitor. (1997)
  • Lee Sang In ID: 9000258136284

    Semiconductor R&D Center, SAMSUNG Electronics Co., San #24, Nongseo–Ri, Kiheung–Eup, Yongin–Si, Kyungki–Do, 449–900 Korea (1997 from CiNii)

    Articles in CiNii:1

    • Preparation and Characterization of Iridium Oxide Thin Films Grown by DC Reactive Sputtering. (1997)
  • Lee Sang In ID: 9000258137501

    Semiconductor R&D Center, SAMSUNG Electronics Co., Yongin–Si, Kyungki–Do 449–900, Korea (1997 from CiNii)

    Articles in CiNii:1

    • Structural and Electrical Properties of Ba0.5Sr0.5TiO3 Films on Ir and IrO2 Electrodes. (1997)
  • Lee Sang In ID: 9000258147650

    Semiconductor R&D Center, SAMSUNG Electronics Co., Ltd., San #24, Nongseo–Ri, Kiheung–Eup, Yongin–Si, Kyungki–Do, 449–900, Korea (1999 from CiNii)

    Articles in CiNii:1

    • Improvement of Photo-Misalignment in Patterned Wafer Bonding Process for Silicon-on-Insulator Device. (1999)
  • Lee Sang In ID: 9000258153626

    Process Development Team, Semiconductor R&D Center, Samsung Electronics Company,<BR> San No. 24, Nongseo-Lee, Kiheung-Eup, Yongin-Si, Kyungki-Do, Korea (2000 from CiNii)

    Articles in CiNii:1

    • Influence of La0.5Sr0.5CoO3 Heterostructure Electrodes on Pb(Zr,Ti)O3 Thin Film Properties. (2000)
  • Lee Sang In ID: 9000258158670

    Semiconductor R&D Division, Samsung Electronics Co., Ltd., Yongin, Kyungki 449-900, Korea (2002 from CiNii)

    Articles in CiNii:1

    • Effects of Pb/Pt Top Electrode on Hydrogen-Induced Degradation in Pb(Zr,Ti)O3. (2002)
  • Lee Sang In ID: 9000401655059

    Articles in CiNii:1

    • Low DamageIn Situ Contact Cleaning Method by a Highly Dense and Directional ECR Plasma (1996)
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