Search Results1-2 of  2

  • Lee Joo-Hyoung ID: 9000258161366

    Memory R&D Division, Hynix Semiconductor Co., Chongju, Choongbuk, 361-480, Korea (2002 from CiNii)

    Articles in CiNii:1

    • Characterization of the Co-Silicide Penetration Depth into the Junction Area for 0.15 and Sub-0.15 Micron CMOS Technology. (2002)
  • Lee Joo-Hyoung ID: 9000401706096

    Articles in CiNii:1

    • Characterization of the Co-Silicide Penetration Depth into the Junction Area for 0.15 and Sub-0.15 Micron CMOS Technology (2002)
Page Top