Search Results1-5 of  5

  • Lee Ming-Hsiu ID: 9000025077541

    Articles in CiNii:1

    • Evaluation of the WOx Film Properties for Resistive Random Access Memory Application (Special Issue : Solid State Devices and Materials (2)) (2012)
  • Lee Ming-Hsiu ID: 9000401805236

    Articles in CiNii:1

    • Evaluation of the WO$_{x}$ Film Properties for Resistive Random Access Memory Application (2012)
  • Lee Ming-Hsiu ID: 9000402006104

    Articles in CiNii:1

    • Evaluation of the WOxFilm Properties for Resistive Random Access Memory Application (2012)
  • Lee Ming-Hsiu ID: 9000402041344

    Articles in CiNii:1

    • Sidewall electrode TiO x /TiO x N y resistive random access memory with excellent memory window control and reliability using plasma oxidation and a novel degradation-detecting writing algorithm (2017)
  • Lee Ming-Hsiu ID: 9000402047867

    Articles in CiNii:1

    • Error free physically unclonable function with programmed resistive random access memory using reliable resistance states by specific identification-generation method (2018)
Page Top