Search Results1-2 of  2

  • Lei Zhifeng ID: 9000402034703

    Articles in CiNii:1

    • Modeling and simulation of ionizing radiation effect on ferroelectric field-effect transistor (2016)
  • Lei Zhifeng ID: 9000402049699

    Articles in CiNii:1

    • Mechanism of high-fluence proton induced electrical degradation in AlGaN/GaN high-electron-mobility transistors (2018)
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