Search Results1-7 of  7

  • LIEW Boon-Khim ID: 9000004822051

    Taiwan Semiconductor Manufacturuing Company (2000 from CiNii)

    Articles in CiNii:1

    • Application of Technology CAD in Process Development for High Performance Logic and System-on-Chip in IC Foundry (2000)
  • LIEW Boon-Khim ID: 9000005607458

    Taiwan Semiconductor Manufacturing Company, R&D Device Department (2000 from CiNii)

    Articles in CiNii:2

    • Analytical Model of Human Body Model Electrostatic Discharge Current Distribution and Novel Electrostatic Discharge Protection Structure (1999)
    • The Mechanism Responsible for a Low Electrostatic Discharge Failure Threshold of an Output Buffer Circuit with Low Current Drive Capability (2000)
  • LIEW Boon-Khim ID: 9000107383635

    Articles in CiNii:1

    • The Method to Optimize Gate Oxide Integrity, Hot Carrier Effect and Electro-Static Discharge without Sacrificing the Performance in Sub-Quarter Micron Dual Gate Oxide Process (1999)
  • Liew Boon-Khim ID: 9000258150312

    Taiwan Semiconductor Manufacturing Company, R&D Device Department (2000 from CiNii)

    Articles in CiNii:1

    • The Mechanism Responsible for a Low Electrostatic Discharge Failure Threshold of an Output Buffer Circuit with Low Current Drive Capability. (2000)
  • Liew Boon-Khim ID: 9000401682118

    Articles in CiNii:1

    • Analytical Model of Human Body Model Electrostatic Discharge Current Distribution and Novel Electrostatic Discharge Protection Structure (1999)
  • Liew Boon-Khim ID: 9000401685527

    Articles in CiNii:1

    • The Method to Optimize Gate Oxide Integrity, Hot Carrier Effect and Electro-Static Discharge without Sacrificing the Performance in Sub-Quarter Micron Dual Gate Oxide Process (1999)
  • Liew Boon-Khim ID: 9000401689784

    Articles in CiNii:1

    • The Mechanism Responsible for a Low Electrostatic Discharge Failure Threshold of an Output Buffer Circuit with Low Current Drive Capability (2000)
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