Search Results1-15 of  15

  • LIU Kuang Yu ID: 9000107350549

    Articles in CiNii:1

    • Measurement of Local Lattice Distortion in Silicon by Imaging-Plate Plane-Wave X-Ray Topography with Image Magnification (1995)
  • LIU Kuang-Yu ID: 9000005561718

    Environment & Analysis Technology Department, Technical Support Center, Sony Corporation (2000 from CiNii)

    Articles in CiNii:2

    • Novel Analysis System of Imaging-Plate Plane-Wave X-Ray Topography for Characterizing Lattice Distortion in Silicon (1994)
    • Determination of the Density and the Thickness of SiO_2 Films Using Extremely Asymmetric X-Ray Diffraction (2000)
  • LIU Kuang-Yu ID: 9000005927963

    Technical Support Center, Sony Corporation (2000 from CiNii)

    Articles in CiNii:1

    • Wavelength-Dispersive Total Reflection X-Ray Fluorescence with High-Brilliance Undulator Radiation at SPring-8 (2000)
  • Liu Kuang Yu ID: 9000258122778

    Sony Corporation Research Center, Hodogaya–ku, Yokohama 240 (1994 from CiNii)

    Articles in CiNii:1

    • Novel Analysis System of Imaging-Plate Plane-Wave X-Ray Topography for Characterizing Lattice Distortion in Silicon. (1994)
  • Liu Kuang Yu ID: 9000258125485

    Sony Corporation Research Center, Hodogaya–ku, Yokohama 240, Japan (1995 from CiNii)

    Articles in CiNii:1

    • Measurement of Local Lattice Distortion in Silicon by Imaging-Plate Plane-Wave X-Ray Topography with Image Magnification. (1995)
  • Liu Kuang Yu ID: 9000401647326

    Articles in CiNii:1

    • Novel Analysis System of Imaging-Plate Plane-Wave X-Ray Topography for Characterizing Lattice Distortion in Silicon (1994)
  • Liu Kuang Yu ID: 9000401654783

    Articles in CiNii:1

    • Measurement of Local Lattice Distortion in Silicon by Imaging-Plate Plane-Wave X-Ray Topography with Image Magnification (1995)
  • Liu Kuang-Yu ID: 9000003382767

    Sony Corporation Research Center (1996 from CiNii)

    Articles in CiNii:3

    • Development of Analysis System for Minute Lattice Strain in Silicon Using Digital X-Ray Diffraction Topography (1995)
    • Lattice Distortion Analysis of Silicon Crystals by Plane-Wave X-Ray Topography Using Imaging Plates (1996)
    • Correction of intensity distribution on plane-wave x-ray topographs using the IP-traverse method (1996)
  • Liu Kuang-Yu ID: 9000256658476

    Sony Corporation Research Center (1995 from CiNii)

    Articles in CiNii:1

    • Development of Analysis System for Minute Lattice Strain in Silicon Using Digital X-Ray Diffraction Topography. (1995)
  • Liu Kuang-Yu ID: 9000401639127

    Articles in CiNii:1

    • Heteroepitaxial Growth of Layered Semiconductor GaSe on a Hydrogen-Terminated Si(111) Surface* (1993)
  • Liu Kuang-Yu ID: 9000401643773

    Articles in CiNii:1

    • Time-Resolved X-Ray Diffraction Measurement of Silicon Surface during Laser Irradiation under Grazing-Incidence Conditions (1994)
  • Liu Kuang-Yu ID: 9000401687638

    Articles in CiNii:1

    • Determination of the Density and the Thickness of SiO2Films Using Extremely Asymmetric X-Ray Diffraction (2000)
  • Liu Kuang-Yu ID: 9000401694034

    Articles in CiNii:1

    • Wavelength-Dispersive Total Reflection X-Ray Fluorescence with High-Brilliance Undulator Radiation at SPring-8 (2000)
  • Liu Kuang-Yu ID: 9000252988794

    Department of Chemistry, The University of Tokyo (1993 from CiNii)

    Articles in CiNii:1

    • Heteroepitaxial Growth of Layered Semiconductor GaSe on a Hydrogen-Terminated Si(111) Surface (1993)
  • Liu Kuang-Yu ID: 9000392733707

    Articles in CiNii:1

    • Heteroepitaxial Growth of Layered Semiconductor GaSe on a Hydrogen-Terminated Si(111) Surface (1993)
Page Top