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  • MATSUSHITA Yoshinori ID: 9000004770784

    日本テキサスインスツルメンツDSP開発物 (1998 from CiNii)

    Articles in CiNii:3

    • Development Environment and test method of a DSP core. (1998)
    • Development Environment and test method of a DSP core (1998)
    • Development Environment and test method of a DSP core (1998)
  • MATSUSHITA Yoshinori ID: 9000004938701

    School of Information Science, Japan Advanced Institute of Science and Technology (2002 from CiNii)

    Articles in CiNii:1

    • A Head-Behavior Synchronization Model with Utterance for Anthropomorphic Spoken-Dialog Agent (2002)
  • MATSUSHITA Yoshinori ID: 9000006791864

    Nagoya Institute of Technology (2008 from CiNii)

    Articles in CiNii:3

    • Characterization of epitaxial p-type 4H-SiC layers by the microwave photoconductivity decay method (2008)
    • Characterization of epitaxial p-type 4H-SiC layers by the microwave photoconductivity decay method (2008)
    • Characterization of epitaxial p-type 4H-SiC layers by the microwave photoconductivity decay method (2008)
  • Matsushita Yoshinori ID: 9000401803606

    Articles in CiNii:1

    • Excess Carrier Lifetime in p-Type 4H-SiC Epilayers with and without Low-Energy Electron Irradiation (2012)
  • Matsushita Yoshinori ID: 9000402004469

    Articles in CiNii:1

    • Excess Carrier Lifetime in p-Type 4H-SiC Epilayers with and without Low-Energy Electron Irradiation (2012)
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