Search Results1-20 of  51

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  • Mikado Tomohisa ID: 9000008206260

    Articles in CiNii:1

    • Backscattering of 24.8-MeV Electrons from C,Al,Cu,and Pb-Energy Spectra of Backscattered Electrons- (1984)
  • Mikado Tomohisa ID: 9000008207545

    Articles in CiNii:1

    • Energy Loss of 24.8-MeV Electrons by Interacting with Thick Layers of C,Al,Cu,and Pb (1983)
  • Mikado Tomohisa ID: 9000403119001

    Articles in CiNii:1

    • Hydrogen-terminated defects in ion-implanted silicon probed by monoenergetic positron beams (2003)
  • MIKADO Tomohisa ID: 9000003274532

    National Institute of Advanced Industrial Science and Technology (AIST) (2004 from CiNii)

    Articles in CiNii:23

    • Investigation of Vacancy-Type Defects in P^+-Implanted 6H-SiC Using Monoenergetic Positron Beams (1998)
    • Characterizing Metal-Oxide Semiconductor Structures Consisting of HfSiO_x as Gate Dielectrics using Monoenergetic Positron Beams (2004)
    • Anomalous Energy Loss and Straggling of 24.8 MeV Electrons through Thin single Crystals of Germanium (1974)
  • MIKADO Tomohisa ID: 9000107335518

    Photonics Research Institute, National Institute of Advanced Industrial Science and Technology (2003 from CiNii)

    Articles in CiNii:1

    • Electron Beam Qualities with and without Free Electron Laser Oscillations in the Compact Storage Ring NIJI-IV (2003)
  • MIKADO Tomohisa ID: 9000107336422

    Photonics Research Institute, National Institute of Advanced Industrial Science and Technology (2004 from CiNii)

    Articles in CiNii:1

    • Evolution of a Storage Ring Free Electron Laser Micropulse in a Macropulse Zone (2004)
  • Mikado Tomohisa ID: 9000252765650

    Electrotechnical Laboratory (1992 from CiNii)

    Articles in CiNii:1

    • Characterization of Diamond Films by Means of a Pulsed Positron Beam (1992)
  • Mikado Tomohisa ID: 9000252957688

    Articles in CiNii:1

    • Decay Rate Plot of Stored Beam Current and Touschek Limit of Current-Lifetime Product (1986)
  • Mikado Tomohisa ID: 9000252975951

    Electrotechnical Laboratory (1991 from CiNii)

    Articles in CiNii:1

    • Characterization of Hydrogenated Amorphous Silicon Films by a Pulsed Positron Beam (1991)
  • Mikado Tomohisa ID: 9000252978853

    Electrotechnical Laboratory (1991 from CiNii)

    Articles in CiNii:1

    • Slow Positron Pulsing System for Variable Energy Positron Lifetime Spectroscopy (1991)
  • Mikado Tomohisa ID: 9000252987677

    Electrotechnical Laboratory (1993 from CiNii)

    Articles in CiNii:1

    • Characterization of Separation-by-Implanted-Oxygen Wafers with Monoenergetic Positron Beams (1993)
  • Mikado Tomohisa ID: 9000254549921

    Electrotechnical Laboratory (1974 from CiNii)

    Articles in CiNii:1

    • Anomalous Energy Loss and Straggling of 24.8 MeV Electrons through Thin Single Crystals of Germanium (1974)
  • Mikado Tomohisa ID: 9000254559450

    High-Energy Radiation Section, Electrotechnical Laboratory (1983 from CiNii)

    Articles in CiNii:1

    • Average Energy Loss of 24.8-MeV Electrons after Passing through and Backscattering from Thick Layers of C, Al, Cu, and Pb (1983)
  • Mikado Tomohisa ID: 9000254559590

    Quantum Technology Division, Electrotechnical Laboratory (1984 from CiNii)

    Articles in CiNii:1

    • Emission-Angle Dependence of Electron Transmission through Thick Layers with Initial Energy of 24.8 MeV (1984)
  • Mikado Tomohisa ID: 9000258119855

    Electrotechnical Laboratory, 1–1–4 Umezono, Tsukuba, Ibaraki 305 (1994 from CiNii)

    Articles in CiNii:1

    • Defects in Heavily Phosphorus-Doped Si Epitaxial Films Probed by Monoenergetic Positron Beams (1994)
  • Mikado Tomohisa ID: 9000258124256

    Electrotechnical Laboratory, 1–1–4 Umezono, Tsukuba–shi, Ibaraki 305 (1994 from CiNii)

    Articles in CiNii:1

    • Lasing at 352 nm of the NIJI-IV Storage-Ring Free-Electron Laser (1994)
  • Mikado Tomohisa ID: 9000258126601

    Electrotechnical Laboratory, 1–1–4 Umezono, Tsukuba, Ibaraki 305, Japan (1995 from CiNii)

    Articles in CiNii:1

    • Vacancy-Type Defects in Ion-Implanted Diamonds Probed by Monoenergetic Postiron Beams. (1995)
  • Mikado Tomohisa ID: 9000258133817

    Electrotechnical Laboratory, 1–1–4 Umezono, Tsukuba, Ibaraki 305, Japan (1997 from CiNii)

    Articles in CiNii:1

    • Annealing Properties of Defects in Ion-Implanted 3C-SiC Studied Using Monoenergetic Positron Beams. (1997)
  • Mikado Tomohisa ID: 9000258135527

    Electrotechnical Laboratory, 1–1–4 Umezono, Tsukuba, Ibaraki 305, Japan (1997 from CiNii)

    Articles in CiNii:1

    • Fluorine-Related Defects in BF+2-Implanted Si Probed by Monoenergetic Positron Beams. (1997)
  • Mikado Tomohisa ID: 9000258138773

    Electrotechnical Laboratory, 1–1–4 Umezono, Tsukuba, Ibaraki 305–8568, Japan (1998 from CiNii)

    Articles in CiNii:1

    • Free Electron Laser Oscillation down to the Deep UV Range Using a Small-Scale Storage Ring. (1998)
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