Search Results1-3 of  3

  • Misumi Tadashi ID: 9000241498247

    Articles in CiNii:1

    • Effects of Trap Levels on Reverse Recovery Surge of Silicon Power Diode (Special Issue : Solid State Devices and Materials) (2013)
  • MISUMI Tadashi ID: 9000006904233

    Toyota Motor Corp. (2011 from CiNii)

    Articles in CiNii:5

    • Analysis of dynamic avalanche phenomenon of PiN diode using He ion irradiation (2006)
    • A Study of Correlation between CiOi Defects and Dynamic Avalanche Phenomenon of PiN Diode Using He ion Irradiation (2008)
    • Effect of Trap Level on Current Dependency of Reverse Recovery Surge Voltage of Diode (2011)
  • Misumi Tadashi ID: 9000402014172

    Articles in CiNii:1

    • Effects of Trap Levels on Reverse Recovery Surge of Silicon Power Diode (2013)
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