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  • MITSUYAMA Teruki ID: 9000004754918

    Course of Electronic Engineering, Graduate School of Engineering. Osaka University (2002 from CiNii)

    Articles in CiNii:5

    • Birefringence Measurement by Low Coherence Interferometry (1999)
    • Simultaneous Measurement of Refractive Index and Thickness of Transparent Plates using the Low Coherence Interferometry : Consideration to Phase and Group Indices (1997)
    • Evaluation of Hardening of UV-light Cured Epoxy by Simultaneous Measurement of Refractive Index and Thickness Using the Low Coherence Interferometry (2002)
  • MITSUYAMA Teruki ID: 9000004876263

    Course of Electronic Engineering, Graduate School of Engineering, Osaka University (2002 from CiNii)

    Articles in CiNii:2

    • Simultaneous Measurement of Refractive Index and Thickness by Low Coherence Interferometry Considering Chromatic Dispersion of Index (2000)
    • Evaluation of Hardening of UV-Light Cured Epoxy by Simultaneous Measurement of Refractive Index and Thickness Using the Low Coherence Interferometry (2002)
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