Search Results1-20 of  46

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  • MIYASAKA Yoichi ID: 9000001719337

    ULSI Device Development Division, NEC Electron Devices, NEC Corporation (2000 from CiNii)

    Articles in CiNii:1

    • Characterization of Ferroelectric Domain Behavior in MOCVD-PZT Capacitors for CMVP FeRAMs (2000)
  • MIYASAKA Yoichi ID: 9000001721928

    Fundamental Research Laboratories, NEC Corporation (1995 from CiNii)

    Articles in CiNii:1

    • High Dielectric Constant (Ba, Sr)TiO_3 Thin Films for ULSI DRAM Application (1995)
  • MIYASAKA Yoichi ID: 9000004753180

    Fundamental Research Laboratories, NEC Corporation (1998 from CiNii)

    Articles in CiNii:15

    • Preparation and Properties of Pb(Zr,Ti)O_3 Thin Films by Multi-Target Sputtering (1994)
    • ECR-Plasma-CVD (Ba, Sr)TiO_3 Capacitor Films for Giga-Bit DRAMs (1996)
    • A 256 Byte Embedded FeRAM Macro Cell for a Smart Card Microcontroller (1998)
  • MIYASAKA Yoichi ID: 9000004817564

    Fundamental Research Laboratories, NEC Corporation (1998 from CiNii)

    Articles in CiNii:3

    • Single 1.5 V Operation Power Amplifier MMIC with SrTiO_3 Capacitors for 2.4 GHz Wireless Applications (1998)
    • SrTiO_3 Capacitor with Relative Dielectric Constant of 200 on GaAs Substrate at Microwave Frequency (1996)
    • Analysis of the Dependence of Ferroelectric Properties of Strontium Bismuth Tantalate (SBT) Thin Films on the Composition and Process Temperature (1996)
  • MIYASAKA Yoichi ID: 9000005678603

    Fundamental Research Laboratories, NEC Corporation (1997 from CiNii)

    Articles in CiNii:1

    • Effect of Reducing Process Temperature for Preparing SrBi_2Ta_2O_9 in a Metal/Ferroelectric/Semiconductor Structure (1997)
  • MIYASAKA Yoichi ID: 9000005738094

    Articles in CiNii:1

    • RuO_2/TiN-Based Storage Electrodes for (Ba, Sr)TiO_3 Dynamic Random Access Memory Capacitors (1995)
  • MIYASAKA Yoichi ID: 9000005754358

    Fundamental Research Laboratories, NEC Corporation (1984 from CiNii)

    Articles in CiNii:1

    • ZnO/SiO_2/Si Diaphragm Bulk Acoustic Wave Composite Resonators : Ultrasonic Transduction (1984)
  • MIYASAKA Yoichi ID: 9000005755636

    Fundamental Research Laboratories, NEC Corporation (1987 from CiNii)

    Articles in CiNii:1

    • Ferroelectric Pb(Zr, Ti)O_3 Thin Films Prepared by Metal Target Sputtering : T: Thin Film (1987)
  • MIYASAKA Yoichi ID: 9000107346112

    Fundamental Research Laboratories, NEC Corporation (1998 from CiNii)

    Articles in CiNii:1

    • Imprint Characteristics of SrBi_2Ta_2O_9 Thin Films with Modified Sr Composition (1998)
  • Miyasaka Yoichi ID: 9000003518507

    NEC Corporation (1991 from CiNii)

    Articles in CiNii:1

    • 29p-N-4 Ferroelectric Thin Film Memory Devices (1991)
  • Miyasaka Yoichi ID: 9000014633372

    Fundamental Research Laboratories, NEC Corporation (1998 from CiNii)

    Articles in CiNii:3

    • Ferroelectric Materials for FeRAMs (1998)
    • LSIメモリー応用のためのペロブスカイト酸化物薄膜 (1992)
    • P-22 ZnO/SiO_2/Si Diaphragm Bulk Acoustic Wave Composite Resonators (1983)
  • Miyasaka Yoichi ID: 9000252767230

    Fundamental Research Laboratories, NEC Corporation (1993 from CiNii)

    Articles in CiNii:1

    • Ferroelectric Properties of Sol-Gel Derived Pb(Zr, Ti)O<SUB>3</SUB> Thin Films (1993)
  • Miyasaka Yoichi ID: 9000252977888

    Fundamental Research Laboratories, NEC Corporation (1991 from CiNii)

    Articles in CiNii:1

    • Reactive Coevaporation Synthesis and Characterization of SrTiO<SUB>3</SUB> Thin Films (1991)
  • Miyasaka Yoichi ID: 9000252978053

    Fundamental Research Laboratories, NEC Corporation (1991 from CiNii)

    Articles in CiNii:1

    • SrTiO<SUB>3</SUB> Thin Film Preparation by Ion Beam Sputtering and Its Dielectric Properties (1991)
  • Miyasaka Yoichi ID: 9000252982548

    Articles in CiNii:1

    • Pb(Zr, Ti)O<SUB>3</SUB> Thin-Film Preparation by Multitarget Magnetron Sputtering (1992)
  • Miyasaka Yoichi ID: 9000252985435

    Articles in CiNii:1

    • Study of Submicron SrTiO<SUB>3</SUB> Patterning (1993)
  • Miyasaka Yoichi ID: 9000252987878

    Fundamental Research Laboratories, NEC Corporation (1993 from CiNii)

    Articles in CiNii:1

    • Structural and Electrical Characterization of SrTiO<SUB>3</SUB> Thin Films Prepared by Metal Organic Chemical Vapor Deposition (1993)
  • Miyasaka Yoichi ID: 9000252987996

    Fundamental Research Laboratories, NEC Corporation (1993 from CiNii)

    Articles in CiNii:1

    • Preparation of Pb(Zr, Ti)O<SUB>3</SUB> Thin Films by Multi-Target Sputtering (1993)
  • Miyasaka Yoichi ID: 9000258129862

    Fundamental Research Laboratories, NEC Corporation, 4–1–1 Miyazaki, Miyamae–ku, Kawasaki, Kanagawa 216, Japan (1995 from CiNii)

    Articles in CiNii:1

    • RuO2/TiN-Based Storage Electrodes for (Ba,Sr)TiO3 Dynamic Random Access Memory Capacitors. (1995)
  • Miyasaka Yoichi ID: 9000258137149

    Fundamental Research Laboratories, NEC Corporation, 4–1–1 Miyamae–ku, Kawasaki 216, Japan (1997 from CiNii)

    Articles in CiNii:1

    • Effect of Reducing Process Temperature for Preparing SrBi2Ta2O9 in a Metal/Ferroelectric/Semiconductor Structure. (1997)
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