Search Results1-20 of  109

  • MORITA MIZUHO ID: 9000001890642

    Department of Radiology, Kobe Medical Center (2006 from CiNii)

    Articles in CiNii:1

    • Genome-wide microsatellite analysis of focal nodular hyperplasia : a strong tool for the differential diagnosis of non-neoplastic liver nodule from hepatocellular carcinoma (2006)
  • MORITA Mizuho ID: 1000020250699

    Graduate School of Engineering, Tohoku University (2014 from CiNii)

    Articles in CiNii:75

    • MD/FEMハイブリッドモデルによる微小切削機構の解析 (1998)
    • 方向安定化レーザービームを直線基準とした高精度形状測定 (1998)
    • 画像圧縮用ベクトル量子化プロセッサ (2001)
  • MORITA Mizuho ID: 9000001189868

    Department of Precision Science and Technology, Graduate School of Engineering, Osaka University (2005 from CiNii)

    Articles in CiNii:2

    • FTIR-ATR Evaluation of Organic Contaminant Cleaning Methods for SiO_2 Surfaces (2003)
    • Photodetector Characteristics of Metal-Oxide-Semiconductor Tunneling Structures with Transparent Conductive Tin Oxide Gate (2005)
  • MORITA Mizuho ID: 9000001193220

    Department of Radiology, Kobe National Hospital (2003 from CiNii)

    Articles in CiNii:2

    • Choroid Plexus Metastasis of Colon Cancer (2003)
    • Malignant Fibrous Histiocytoma Arising from the Renal Capsule (2003)
  • MORITA Mizuho ID: 9000001675825

    Department of Precision Science and Technology, Graduate School of Engineering, Osaka University (2009 from CiNii)

    Articles in CiNii:10

    • Reaction of Hydrogen-Terminated Si(100) Surfaces with Oxygen at Very Low Pressures during Heating (2005)
    • Nano-Gap Device for Liquid Sensing (2004)
    • Development of Nanao-Gap Device for Biosensor (2005)
  • MORITA Mizuho ID: 9000001720176

    Department of Electronic Engineering, Faculty of Engineering, Tohoku University (1996 from CiNii)

    Articles in CiNii:1

    • Native Oxide Growing Behavior on Si Crystal Structure and Resistivity (1996)
  • MORITA Mizuho ID: 9000002165495

    Osaka Univ. (1999 from CiNii)

    Articles in CiNii:1

    • Evaluation of SOI Wafer Quality and Technological Issues to be Solved (1999)
  • MORITA Mizuho ID: 9000002169735

    Department of Precision Science and Technology, Graduate School of Engineering, Osaka University (2005 from CiNii)

    Articles in CiNii:1

    • Surface Hall Potentiometry to Characterize Functional Semiconductor Films (2005)
  • MORITA Mizuho ID: 9000004965983

    Department of Electronic Engineering, Faculty of Engineering, Tohoku Univerisity:Laboratory for Elecric Intelligent Systems, Research Institute of Electrical Communication, Tohoku Univerisity (1997 from CiNii)

    Articles in CiNii:1

    • Design Guidelines of Fully-Depleted SOI MOSFET's by Using Tantalum as Gate Material (1997)
  • MORITA Mizuho ID: 9000005654684

    Department of Information Science, Graduate School of Information Sciences, Tohoku University:Laboratory for Microelectronics, Research Institute of Electrical Communication, Tohoku University (1994 from CiNii)

    Articles in CiNii:1

    • Dopant-Free Channel Transistor with Punchthrough Control Region under Source and Drain (1994)
  • MORITA Mizuho ID: 9000107346467

    Department of Precision Science and Technology, Graduate School of Engineering, Osaka University (2004 from CiNii)

    Articles in CiNii:1

    • Tunneling Current through Ultrathin Silicon Dioxide Films under Light Exposure (2004)
  • MORITA Mizuho ID: 9000107346530

    Department of Precision Science and Technology, Graduate School of Engineering, Osaka University (2004 from CiNii)

    Articles in CiNii:1

    • Reaction of Hydrogen-Desorbed Si(100) Surfaces with Water during Heating and Cooling (2004)
  • MORITA Mizuho ID: 9000107388603

    Department of Precision Science and Technology, Osaka University (2004 from CiNii)

    Articles in CiNii:1

    • Visible Light Irradiation Effects on STM Observations of Hydrogenated Amorphous Silicon Surfaces (2004)
  • MORITA Mizuho ID: 9000253647981

    Faculty of Engineering, Tohoku University (1991 from CiNii)

    Articles in CiNii:1

    • Oxidation Mechanism of Hydrogen-Terminated Silicon Surface. (1991)
  • MORITA Mizuho ID: 9000257794748

    Department of Precision Science and Technology, Graduate School of Engineering, Osaka University (2009 from CiNii)

    Articles in CiNii:1

    • Metal-Insulator-Gap-Insulator-Semiconductor Structure for Sensing Devices (2009)
  • MORITA Mizuho ID: 9000299558940

    Osaka University (2015 from CiNii)

    Articles in CiNii:1

    • Fundamental Properties of Metal-Assisted Chemical Etching of Ge Surfaces Mediated by Dissolved O<sub>2</sub> Molecules in Water (2015)
  • Morita MIzuho ID: 9000347216945

    Osaka University (2015 from CiNii)

    Articles in CiNii:1

    • Flattening of Ge surfaces in water by catalytic activity of metals enhancing oxygen reduction reaction (2015)
  • Morita Mizuho ID: 9000047153008

    Articles in CiNii:1

    • Characterization of Void in Bonded Silicon-on-Insulator Wafers by Controlling Coherence Length of Light Source using Near-Infrared Microscope (2007)
  • Morita Mizuho ID: 9000055341220

    Articles in CiNii:1

    • Characterization of Tunneling Current through Ultrathin Silicon Dioxide Films by Different-Metal Gates Method (2008)
  • Morita Mizuho ID: 9000058282947

    Articles in CiNii:1

    • Absolute Line Profile Measurements of Silicon Plane Mirrors by Near-Infrared Interferometry (2008)
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