Search Results1-9 of  9

  • MAEKAWA Keiichi ID: 9000000404104

    Graduate student, Nagoya University (1999 from CiNii)

    Articles in CiNii:1

    • Effect of MIM Process Conditions on Microstructures and Mechanical Properties of Ti-6Al-4V Compacts (1999)
  • MAEKAWA Keiichi ID: 9000001166983

    Honda R & D Co., Ltd. (2005 from CiNii)

    Articles in CiNii:2

    • ダクタイル鋳鉄管を用いた摩擦圧接 (2001)
    • Friction Welding of Ductile Cast Iron Pipes (2005)
  • MAEKAWA Keiichi ID: 9000005895657

    Articles in CiNii:5

    • Back-Bias Control Technique for Suppression of Die-to-Die Delay Variability of SOTB CMOS Circuits at Ultralow-Voltage (0.4 V) Operation (2016)
    • Ultralow-Voltage Operation of Silicon-on-Thin-BOX (SOTB) 2Mbit SRAM Down to 0.37 V Utilizing Adaptive Back Bias (2016)
    • Layout Dependence Caused by Shallow-Trench-Isolation-Induced Stress of MOSFET's Drain-Current (2004)
  • MAEKAWA Keiichi ID: 9000006736419

    Department of Mechanical Engineering, Kinki University Technical College (2006 from CiNii)

    Articles in CiNii:1

    • P222 Simultaneous Thermal Disposal and Energy Utilization of Offal and Bark (2006)
  • MAEKAWA Keiichi ID: 9000021357213

    Renesas Technology Corp. (2007 from CiNii)

    Articles in CiNii:1

    • Development of Evaluation Method for Estimating Stress-Induced Change in Drain Current in Deep-sub-micron MOSFETs (2007)
  • Maekawa Keiichi ID: 9000304970480

    Low-power Electronics Association & Project(LEAP) (2014 from CiNii)

    Articles in CiNii:1

    • A Perpetuum Mobile 32bit CPU with 13.4pJ/cycle, 0.14μA Sleep Current using Reverse-Body-Bias Assisted 65nm SOTB CMOS Technology (2014)
  • Maekawa Keiichi ID: 9000304970723

    Low-power Electronics Association & Project(LEAP) (2014 from CiNii)

    Articles in CiNii:1

    • A Perpetuum Mobile 32bit CPU with 13.4pJ/cycle, 0.14μA Sleep Current using Reverse-Body-Bias Assisted 65nm SOTB CMOS Technology (2014)
  • Maekawa Keiichi ID: 9000402047817

    Articles in CiNii:1

    • Revisited study of fluorine implantation impact on negative bias temperature instability for input/output device of automotive micro controller unit (2018)
  • Maekawa Keiichi ID: 9000402047832

    Articles in CiNii:1

    • 2018-03-19 (2018)
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