Search Results1-20 of  24

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  • MAEKAWA TAKAO ID: 9000310319242

    Yamagata Univ. (2010 from CiNii)

    Articles in CiNii:1

    • P-72 Diversity and distribution of mcrA genes in the coastal sediment of the Shonai area(Poster Session) (2010)
  • MAEKAWA Takao ID: 9000000793181

    日本テレコム株式会社サービス開発本部 (2002 from CiNii)

    Articles in CiNii:1

    • 情報通信技術の標準化動向 (2002)
  • MAEKAWA Takao ID: 9000004754124

    Articles in CiNii:6

    • 情報通信網の運用管理の効率化へ向けて (2003)
    • Capabilities to realize the end-to-end QoS requirements in the multi Service Providers networks (2001)
    • The Method how to obtain the reliability on the Customer Network Management Service (1999)
  • MAEKAWA Takao ID: 9000004898425

    Network Consulting Managements Division, Japan Telecom Co., Ltd. (2004 from CiNii)

    Articles in CiNii:1

    • IP Network Management (2004)
  • MAEKAWA Takao ID: 9000005890971

    Department of Electronics, Chiba Institute of Technology (2000 from CiNii)

    Articles in CiNii:1

    • Evaluations of Carrier Lifetime in Silicon Epitaxial Layers Grown on Lightly Doped Substrates (2000)
  • MAEKAWA Takao ID: 9000006456217

    Department of Electronics, Chiba Institute of Technology (2002 from CiNii)

    Articles in CiNii:1

    • Evaluation of Effective Recombination Velocity Related to the Potential Barrier in n/n^+ Silicon Epitaxial Wafers (2002)
  • MAEKAWA Takao ID: 9000045705050

    Department of Electronics, Chiba Institute of Technology (1995 from CiNii)

    Articles in CiNii:1

    • Measurable Range of Bulk Carrier Lifetime for a Thick Silicon Wafer by Induced Eddy Current Method (1995)
  • MAEKAWA Takao ID: 9000107347397

    Articles in CiNii:1

    • Effect of Steady Bias Light on Carrier Lifetime in Silicon Wafers with Chemically Passivated Surfaces (1996)
  • MAEKAWA Takao ID: 9000253322449

    Department of Electronics, Chiba Institute of Technology (1981 from CiNii)

    Articles in CiNii:1

    • Measurement of Resistivity Variation in a Semiconductor Wafer by Using a Photovoltaic Method (1981)
  • Maekawa Takao ID: 9000002506107

    リクルート (2001 from CiNii)

    Articles in CiNii:1

    • 対談 これからの生涯学習--大学の役割・使命について--前川孝雄,清水啓典,金口恭久 (特集 大学と生涯学習) (2001)
  • Maekawa Takao ID: 9000006864606

    山形大・農 (2009 from CiNii)

    Articles in CiNii:3

    • 08-158 Analysis of microbial community structure incoastalsediment corrected from the Sea of Japan(Microbial community analysis) (2008)
    • P-72 月山弥陀ヶ原湿原におけるFormyltetrahydrofolate synthetase遺伝子の多様性解析(ポスター発表) (2009)
    • P-74 庄内沿岸域堆積物における真正細菌・古細菌の多様性と分布(ポスター発表) (2009)
  • Maekawa Takao ID: 9000252757835

    Department of Electronics, Chiba Institute of Technology (1983 from CiNii)

    Articles in CiNii:1

    • Contactless Measurement of Photoinduced Carrier Lifetime and Injection Level in Silicon Wafer Using Additional Eddy Current (1983)
  • Maekawa Takao ID: 9000252766674

    Department of Electronics, Chiba Institute of Technology (1993 from CiNii)

    Articles in CiNii:1

    • Contactless Measurement of Carrier Lifetime in Silicon Thick Wafers (1993)
  • Maekawa Takao ID: 9000258131193

    Department of Electronics, Chiba Institute of Technology, Tsudanuma, Narashino, Chiba 275, Japan (1996 from CiNii)

    Articles in CiNii:1

    • Effect of Steady Bias Light on Carrier Lifetime in Silicon Wafers with Chemically Passivated Surfaces. (1996)
  • Maekawa Takao ID: 9000258152669

    Department of Electronics, Chiba Institute of Technology, Tsudanuma, Narashino, Chiba 275-0016, Japan (2000 from CiNii)

    Articles in CiNii:1

    • Evaluations of Carrier Lifetime in Silicon Epitaxial Layers Grown on Lightly Doped Substrates. (2000)
  • Maekawa Takao ID: 9000391903444

    Okayama University (2008 from CiNii)

    Articles in CiNii:1

    • System Fault Detection Using Observer Connected by Network (2008)
  • Maekawa Takao ID: 9000392693784

    Articles in CiNii:1

    • Contactless Measurement of Photoinduced Carrier Lifetime and Injection Level in Silicon Wafer Using Additional Eddy Current (1983)
  • Maekawa Takao ID: 9000392721301

    Articles in CiNii:1

    • Contactless Measurement of Carrier Lifetime in Silicon Thick Wafers (1993)
  • Maekawa Takao ID: 9000401593330

    Articles in CiNii:1

    • Contactless Measurement of Photoinduced Carrier Lifetime and Injection Level in Silicon Wafer Using Additional Eddy Current (1983)
  • Maekawa Takao ID: 9000401636833

    Articles in CiNii:1

    • Contactless Measurement of Carrier Lifetime in Silicon Thick Wafers (1993)
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