Search Results1-10 of  10

  • Makiyama Hideki ID: 9000241500483

    Articles in CiNii:1

    • Statistical Analysis of Subthreshold Swing in Fully Depleted Silicon-on-Thin-Buried-Oxide and Bulk Metal-Oxide-Semiconductor Field Effect Transistors (Special Issue : Solid State Devices and Materials) (2013)
  • MAKIYAMA Hideki ID: 9000240238595

    Articles in CiNii:15

    • Novel Single p+Poly-Si/Hf/SiON Gate Stack Technology on Silicon-on-Thin-Buried-Oxide (SOTB) for Ultra-Low Leakage Applications (2015)
    • Novel Single p+Poly-Si/Hf/SiON Gate Stack Technology on Silicon-on-Thin-Buried-Oxide (SOTB) for Ultra-Low Leakage Applications (2015)
    • Back-Bias Control Technique for Suppression of Die-to-Die Delay Variability of SOTB CMOS Circuits at Ultralow-Voltage (0.4 V) Operation (2016)
  • Makiyama Hideki ID: 9000304970469

    Low-power Electronics Association & Project(LEAP) (2014 from CiNii)

    Articles in CiNii:1

    • A Perpetuum Mobile 32bit CPU with 13.4pJ/cycle, 0.14μA Sleep Current using Reverse-Body-Bias Assisted 65nm SOTB CMOS Technology (2014)
  • Makiyama Hideki ID: 9000304970712

    Low-power Electronics Association & Project(LEAP) (2014 from CiNii)

    Articles in CiNii:1

    • A Perpetuum Mobile 32bit CPU with 13.4pJ/cycle, 0.14μA Sleep Current using Reverse-Body-Bias Assisted 65nm SOTB CMOS Technology (2014)
  • Makiyama Hideki ID: 9000401990385

    Articles in CiNii:1

    • Low-power embedded read-only memory using atom switch and silicon-on-thin-buried-oxide transistor (2015)
  • Makiyama Hideki ID: 9000402013438

    Articles in CiNii:1

    • 2013-04-01 (2013)
  • Makiyama Hideki ID: 9000402021468

    Articles in CiNii:1

    • Speed enhancement atVdd= 0.4 V and random τpdvariability reduction and analyisis of τpdvariability of silicon on thin buried oxide circuits (2014)
  • Makiyama Hideki ID: 9000402021546

    Articles in CiNii:1

    • Comparison and distribution of minimum operation voltage in fully depleted silicon-on-thin-buried-oxide and bulk static random access memory cells (2014)
  • Makiyama Hideki ID: 9000402028485

    Articles in CiNii:1

    • Detailed analysis of minimum operation voltage of extraordinarily unstable cells in fully depleted silicon-on-buried-oxide six-transistor static random access memory (2015)
  • Makiyama Hideki ID: 9000402047833

    Articles in CiNii:1

    • 2018-03-19 (2018)
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