Search Results1-20 of  53

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  • Matsuhata Hirofumi ID: 9000009550919

    Articles in CiNii:1

    • Critical Voltage Analysis of Oxygen Content in High Tc Superconductors (High Technology Materials-1-<Special Issue>) (1991)
  • MATSUHATA Hirofumi ID: 9000001259943

    産業技術総合研究所エレクトロニクス研究部門 (2004 from CiNii)

    Articles in CiNii:2

    • Critical Phenomena and Degeneracies Observed in Electron Diffraction (2004)
    • Critical Phenomena and Degeneracies Observed in Electron Diffraction (2004)
  • MATSUHATA Hirofumi ID: 9000001704216

    Nanoelectronics Research Institute, National Institute of Advanced Industrial Science and Technology (AIST) (2005 from CiNii)

    Articles in CiNii:1

    • Reference sample for the evaluation of SEM image resolution at a high magnification-nanometer-scale Au particles on an HOPG substrate (2005)
  • MATSUHATA Hirofumi ID: 9000005552606

    Nanoelectronics Research Institute, National Institute of Advanced Industrial Science and Technology (AIST), Central 2 (2004 from CiNii)

    Articles in CiNii:7

    • Structure Analysis of GaN Thin Film with Inversion Domains by High Voltage Atomic Resolution Microscopy (2002)
    • Studies on the structure of crescent-shaped GaAs quantum wires by combination of electron microscopy and photoluminescence spectroscopy (2000)
    • Behaviors of surfactant atoms on Si(001) surface (2004)
  • MATSUHATA Hirofumi ID: 9000005917299

    Nanoelectronics Research Institute, AIST (2001 from CiNii)

    Articles in CiNii:1

    • An Improved Method for Obtaining Single-Phase Sr_2MoO_4 under Controlled Ultralow Oxygen Partial Pressure (2001)
  • MATSUHATA Hirofumi ID: 9000006555441

    National Institute of Advanced Industrial Science and Technology (2008 from CiNii)

    Articles in CiNii:3

    • T_c vs n Relationship for Multilayered High-T_c Superconductors (2007)
    • Effect of Structural Parameters on Superconductivity in Fluorine-Free LnFeAsO_<1-y> (Ln = La,Nd) (2008)
    • Structural Analysis of Fluorine-Free Oxypnictide Superconductor NdFeAsO_<1-y> by Electron Diffraction Analysis and Electron Microscopy (2008)
  • MATSUHATA Hirofumi ID: 9000020023510

    電子技術総合研究所 (1993 from CiNii)

    Articles in CiNii:1

    • Microstructure and Optical Properties of Si/Ge Strained-Layer Superlattice. (1993)
  • MATSUHATA Hirofumi ID: 9000021959461

    Articles in CiNii:1

    • Recent Advences in X-ray Topography (2012)
  • MATSUHATA Hirofumi ID: 9000107383202

    Electrotechnical Laboratory (1996 from CiNii)

    Articles in CiNii:1

    • Fabrication of Quantum Wire and Minute Buried Heterostructure by In Situ Etching and Selective MOCVD Growth (1996)
  • MATSUHATA Hirofumi ID: 9000253327016

    Electron Devices Division, Electrotechnical Laboratory. (1998 from CiNii)

    Articles in CiNii:1

    • Surface migration induced self-limited growth for an atomic control of quantum nanostructures (1998)
  • Matsuhata Hirofumi ID: 9000003429369

    (present address) ETL (1990 from CiNii)

    Articles in CiNii:5

    • 30p-M-1 菊池線交差法の銅および銅合金への応用 (1982)
    • 6p-W-6 Dynamical electron diffraction effect in nonsystematic 4 beam excitation (1989)
    • 1p-KK-9 超高圧電子顕微鏡を利用したダイヤモンド型結晶の構造因子の決定 (1984)
  • Matsuhata Hirofumi ID: 9000020235428

    <I>Electrotechnical Laboratory</I> (1997 from CiNii)

    Articles in CiNii:1

    • Evidence for Critical Strain in Mismatched Epitaxial Growth: Atomic Migration Induced by Strain (1997)
  • Matsuhata Hirofumi ID: 9000247078660

    Toyota Technological Institute (1989 from CiNii)

    Articles in CiNii:1

    • 30p-TH-13 Study of Electron Channeling Radiation by Dynamical Theory and It's Observation (1989)
  • Matsuhata Hirofumi ID: 9000252952683

    Department of Materials Science and Technology, Graduate School of Engineering Sciences (1983 from CiNii)

    Articles in CiNii:1

    • Critical Voltage Effect in Ni<SUB>3</SUB>Fe and FeCo Ordering Alloys (1983)
  • Matsuhata Hirofumi ID: 9000252973465

    Toyota Technological Institute (1990 from CiNii)

    Articles in CiNii:1

    • Channeling Radiation from 1 MeV Electrons (1990)
  • Matsuhata Hirofumi ID: 9000252982829

    Electrotechnical Laboratory (1992 from CiNii)

    Articles in CiNii:1

    • Ge Distribution in Ge<I><SUB>n</SUB></I>/Si<I><SUB>m</SUB></I> Strained-Layer Superlattices (1992)
  • Matsuhata Hirofumi ID: 9000252988380

    Electrotechnical Laboratory (1993 from CiNii)

    Articles in CiNii:1

    • Thermally-Induced Transformation of Phthalocyanine Microcrystals into Monomers in Polyamic Acid Film Prepared by Vapor Deposition Polymerization (1993)
  • Matsuhata Hirofumi ID: 9000252988640

    Electrotechnical Laboratory (1993 from CiNii)

    Articles in CiNii:1

    • Which Surfactant Shall We Choose for the Heteroepitaxy of Ge/Si(001)? —Bi as a Surfactant with Small Self-Incorporation— (1993)
  • Matsuhata Hirofumi ID: 9000253493146

    Articles in CiNii:1

    • In-situ observation of insulator to metal phase transition of Y<SUB>1-x</SUB>Ca<SUB>x</SUB>TiO<SUB>3</SUB> (x=0.37, 39, 41) by transmission electron microscopy (2007)
  • Matsuhata Hirofumi ID: 9000258121943

    Electrotechnical Laboratory, 1–1–4 Umezono, Tsukuba 305 (1994 from CiNii)

    Articles in CiNii:1

    • Abrupt Si/Ge/Si(001) Interfaces Fabricated with Bi as a Surfactant. (1994)
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