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  • Meiring Jason E. ID: 9000010004103

    Articles in CiNii:1

    • Line Edge Roughness in Chemically Amplified Resist: Speculation, Simulation and Application (2005)
  • Meiring Jason E. ID: 9000257896837

    Department of Chemistry, The University of Texas at Austin|Department of Chemical Engineering, The University of Texas at Austin (2005 from CiNii)

    Articles in CiNii:1

    • Line Edge Roughness in Chemically Amplified Resist: Speculation, Simulation and Application (2005)
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