Search Results1-20 of  23

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  • Takeda Michihiko ID: 9000008325517

    Articles in CiNii:1

    • Electron-Beam Doping(Wada′s Experiments)--New Phenomena and New Technology-1-Experiments(Review) (1984)
  • Michihiko Takeda ID: 9000344804265

    Articles in CiNii:1

    • Electron-Beam Doping (Wada's Experiments) (1985)
  • TAKEDA Michihiko ID: 9000005531822

    Government Industrial Research Institute (1977 from CiNii)

    Articles in CiNii:1

    • Distribution of Radiation-Damage Rate with Depth in Silicon Bombarded with the High Energy Electrons (1977)
  • TAKEDA Michihiko ID: 9000020061259

    Government Industrial Research Institute, Nagoya (1988 from CiNii)

    Articles in CiNii:1

    • Electron beam oxidation of semiconductors. (1988)
  • TAKEDA Michihiko ID: 9000020107232

    Government Industrial Research Institute, Nagoya (1988 from CiNii)

    Articles in CiNii:1

    • Surface diffusion of impurity in semiconductors by electron-beam doping. (1988)
  • TAKEDA Michihiko ID: 9000020152258

    Government Industrial Research Institute (1989 from CiNii)

    Articles in CiNii:1

    • Interdiffusion by high-energy electron beam irradiation. (1989)
  • TAKEDA Michihiko ID: 9000020200388

    Government Industrial Research Institute, Nagoya (1987 from CiNii)

    Articles in CiNii:1

    • Impurity doping in semiconductors using high-energy electron bombardment. (1987)
  • TAKEDA Michihiko ID: 9000020200712

    Government Industrial Research Institute, Nagoya (1987 from CiNii)

    Articles in CiNii:1

    • Preparation of ZnSe films by RF sputtering. (1987)
  • TAKEDA Michihiko ID: 9000020228881

    Government Industrial Research Institute (1990 from CiNii)

    Articles in CiNii:1

    • Surface diffusion of impurity in semiconductors by electron-beam doping(II) Ga in Si substrate. (1990)
  • TAKEDA Michihiko ID: 9000020308523

    Government Industrial Research Institute (1971 from CiNii)

    Articles in CiNii:1

    • On a Method for Measuring Pulsed X-ray with Low Intensity (1971)
  • TAKEDA Michihiko ID: 9000020326240

    Government Industrial Research Institute, Nagoya (1986 from CiNii)

    Articles in CiNii:1

    • Amorphous hydrogenated carbon films prepared from butane gas. (1986)
  • Takeda Michihiko ID: 9000252943917

    Government Industrial Research Institute, Nagoya (1977 from CiNii)

    Articles in CiNii:1

    • Distribution of Radiation-Damage Rate with Depth in Silicon Bombarded with the High Energy Electrons (1977)
  • Takeda Michihiko ID: 9000252967380

    Government Industrial Research Institute (1988 from CiNii)

    Articles in CiNii:1

    • Electron Irradiation of Y–Ba–Cu Oxides (1988)
  • Takeda Michihiko ID: 9000252991358

    Government Industrial Research Institute, Nagoya (1968 from CiNii)

    Articles in CiNii:1

    • Pulsed X-Ray Radiography with Electron Linear Accelerator (I) Precise Control of Electron Linear Accelerator (1968)
  • Takeda Michihiko ID: 9000254125862

    Articles in CiNii:1

    • Total Absorption Measurements for 250–1000 MeV Photons in Carbon, Aluminium and Titanium (1972)
  • Takeda Michihiko ID: 9000254548966

    Articles in CiNii:1

    • Total Absorption Measurements for 450–1000 MeV Photons in Various Materials (1973)
  • Takeda Michihiko ID: 9000392688319

    Articles in CiNii:1

    • Pulsed X-Ray Radiography with Electron Linear Accelerator (I) Precise Control of Electron Linear Accelerator (1968)
  • Takeda Michihiko ID: 9000392696370

    Articles in CiNii:1

    • Electron Irradiation of Y–Ba–Cu Oxides (1988)
  • Takeda Michihiko ID: 9000401582712

    Articles in CiNii:1

    • Distribution of Radiation-Damage Rate with Depth in Silicon Bombarded with the High Energy Electrons (1977)
  • Takeda Michihiko ID: 9000401608425

    Articles in CiNii:1

    • Electron Irradiation of Y-Ba-Cu Oxides (1988)
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