Search Results1-20 of  22

  • 1 / 2
  • Miyamura Makoto ID: 9000025037969

    Articles in CiNii:1

    • Electron holography characterization of ultra shallow junctions in 30-nm-gate-length metal-oxide-semiconductor field-effect transistors (Special issue: Solid state devices and materials) (2008)
  • MIYAMURA Makoto ID: 9000002166170

    NEC Corporation, Device Platforms Research Laboratories (2007 from CiNii)

    Articles in CiNii:2

    • 1.2nm HfSiON/SiON stacked gate insulators for 65nm-node MISFETs (2004)
    • Electron Holography Characterization of Ultra-Shallow Junctions in 30-nm Gate-length MOS-FETs (2007)
  • MIYAMURA Makoto ID: 9000107346222

    System Devices Research Laboratories, NEC Corp. (2004 from CiNii)

    Articles in CiNii:1

    • Origin of Flatband Voltage Shift in Poly-Si/Hf-Based High-k Gate Dielectrics and Flatband Voltage Dependence on Gate Stack Structure (2004)
  • MIYAMURA Makoto ID: 9000242869650

    Low-power Electronics Association and Project (LEAP) (2013 from CiNii)

    Articles in CiNii:3

    • First Demonstration of Logic Mapping on Nonvolatile Programmable Cell Using Complementary Atom Switch (2013)
    • Smart Interconnect Technology using Atom Switch for Low-power Programmable Logic (2013)
    • Invited Talk Complementary atom-switch based programmable cell array and its demonstration of logic mapping synthesized from RTL code (2013)
  • MIYAMURA Makoto ID: 9000244006787

    Low-power Electronics Association and Project(LEAP) (2013 from CiNii)

    Articles in CiNii:1

    • Complementary atom-switch based programmable cell array and its demonstration of logic mapping synthesized from RTL code (2013)
  • Miyamura Makoto ID: 9000020815551

    Department of Chemical Engineering, Osaka University (1991 from CiNii)

    Articles in CiNii:1

    • Synergistic extraction of rare-earth elements by tri-n-octylmethylammonium nitrate and .BETA.-diketone. (1991)
  • Miyamura Makoto ID: 9000020869785

    Department of Chemical Engineering, Osaka University (1990 from CiNii)

    Articles in CiNii:1

    • Extraction and separation of rare-earth elements by tri-n-octylmethylammonium nitrate. (1990)
  • Miyamura Makoto ID: 9000240062930

    Green Platform Research Laboratories, NEC Corp. (2013 from CiNii)

    Articles in CiNii:1

    • A Non-volatile Reconfigurable Offloader for Wireless Sensor Nodes (2013)
  • Miyamura Makoto ID: 9000240071176

    Green Platform Research Laboratories, NEC Corp. (2013 from CiNii)

    Articles in CiNii:1

    • A Non-volatile Reconfigurable Offloader for Wireless Sensor Nodes (2013)
  • Miyamura Makoto ID: 9000258170758

    System Devices Research Laboratories, NEC Corp. (2004 from CiNii)

    Articles in CiNii:1

    • Origin of Flatband Voltage Shift in Poly-Si/Hf-Based High-k Gate Dielectrics and Flatband Voltage Dependence on Gate Stack Structure (2004)
  • Miyamura Makoto ID: 9000311494787

    Green Platform Research Laboratories, NEC Corporation (2015 from CiNii)

    Articles in CiNii:1

    • C-12-1 Static Timing Analysis (STA) on NanoBridge based programmable logic (2015)
  • Miyamura Makoto ID: 9000401731123

    Articles in CiNii:1

    • Origin of Flatband Voltage Shift in Poly-Si/Hf-Based High-k Gate Dielectrics and Flatband Voltage Dependence on Gate Stack Structure (2004)
  • Miyamura Makoto ID: 9000401768298

    Articles in CiNii:1

    • 2008-04-25 (2008)
  • Miyamura Makoto ID: 9000401798905

    Articles in CiNii:1

    • ON-State Reliability of Solid-Electrolyte Switch under Pulsed Alternating Current Stress for Programmable Logic Device (2011)
  • Miyamura Makoto ID: 9000401977595

    Articles in CiNii:1

    • An atom-switch-based field-programmable gate array with optimized driving capability buffer (2019)
  • Miyamura Makoto ID: 9000401990390

    Articles in CiNii:1

    • Low-power embedded read-only memory using atom switch and silicon-on-thin-buried-oxide transistor (2015)
  • Miyamura Makoto ID: 9000401999774

    Articles in CiNii:1

    • ON-State Reliability of Solid-Electrolyte Switch under Pulsed Alternating Current Stress for Programmable Logic Device (2011)
  • Miyamura Makoto ID: 9000402021610

    Articles in CiNii:1

    • Impact of overshoot current on set operation of atom switch (2014)
  • Miyamura Makoto ID: 9000402028559

    Articles in CiNii:1

    • Mechanism of OFF-state lifetime improvement in complementary atom switch (2015)
  • Miyamura Makoto ID: 9000402029542

    Articles in CiNii:1

    • Publisher's Note: "Mechanism of OFF-state lifetime improvement in complementary atom switch" (2015)
  • 1 / 2
Page Top