Search Results1-20 of  21

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  • Miyato Yuji ID: 9000019043907

    Articles in CiNii:1

    • Investigations of Local Electrical Characteristics of a Pentacene Thin Film by Point-Contact Current Imaging Atomic Force Microscopy (Special Issue : Scanning Probe Microscopy) (2012)
  • Miyato Yuji ID: 9000025086921

    Articles in CiNii:1

    • Position control and electrical characterization of single-walled carbon nanotubes debundled by density gradient ultracentrifugation (Special issue: Carbon nanotube nanoelectronics) (2010)
  • Miyato Yuji ID: 9000025087573

    Articles in CiNii:1

    • Surface potential investigation of carbon nanotube field-effect transistor by point-by-point atomic force microscope potentiometry (Special issue: Carbon nanotube nanoelectronics) (2010)
  • MIYATO Yuji ID: 9000018554319

    Dept. of Electronic Science Engineering, Kyoto University (2011 from CiNii)

    Articles in CiNii:1

    • Basics of Carbon Nanotube and Its Applications : High expectations of technological innovation by carbon nanotube as new carbon material, and facing challenges for its practical applications (2011)
  • MIYATO Yuji ID: 9000019117368

    Articles in CiNii:14

    • Simulation analysis of one machine infinite bus system with Superconducting fault current limiter (2001)
    • Basic consideration on overvoltage suppression in inductive Superconducting Fault Current Limiter (2002)
    • Investigation on SQUID gradiometer and its application to STM-SQUID (2012)
  • MIYATO Yuji ID: 9000107375902

    Department of Electronic Science and Engineering, Kyoto University (2005 from CiNii)

    Articles in CiNii:1

    • Local Surface Potential Measurements of Carbon Nanotube FETs by Kelvin Probe Force Microscopy (2005)
  • MIYATO Yuji ID: 9000266899406

    Department of Systems Innovation, Graduated School of Engineering Science, Osaka University (2014 from CiNii)

    Articles in CiNii:1

    • STM-SQUID Microscope (2014)
  • Miyato Yuji ID: 9000024144357

    Articles in CiNii:1

    • Resistive switching effects in single metallic tunneling junction with nanometer-scale gap (2011)
  • Miyato Yuji ID: 9000024275515

    Articles in CiNii:1

    • Piezoresistive properties of carbon nanotubes under radial force investigated by atomic force microscopy (2008)
  • Miyato Yuji ID: 9000025029471

    Articles in CiNii:1

    • Multi-probe atomic force microscopy with optical beam deflection method (Special issue: Scanning probe microscopy) (2007)
  • Miyato Yuji ID: 9000025029831

    Articles in CiNii:1

    • Multi-probe atomic force microscopy using piezoelectric cantilevers (Special issue: Scanning probe microscopy) (2007)
  • Miyato Yuji ID: 9000250182575

    Articles in CiNii:1

    • Local potential profiling of operating carbon nanotube transistor using frequency-modulation high-frequency electrostatic force microscopy (2013)
  • Miyato Yuji ID: 9000257785458

    Department of Electronic Science and Engineering, Kyoto University, Japan (2011 from CiNii)

    Articles in CiNii:1

    • Effect of Trapped Charges on Local Potential Measurement of Carbon Nanotubes Using Frequency-Modulation Kelvin-Probe Force Microscopy (2011)
  • Miyato Yuji ID: 9000258180291

    Department of Electronic Science and Engineering, Kyoto University (2005 from CiNii)

    Articles in CiNii:1

    • Local Surface Potential Measurements of Carbon Nanotube FETs by Kelvin Probe Force Microscopy (2005)
  • Miyato Yuji ID: 9000401734980

    Articles in CiNii:1

    • Local Surface Potential Measurements of Carbon Nanotube FETs by Kelvin Probe Force Microscopy (2005)
  • Miyato Yuji ID: 9000401785347

    Articles in CiNii:1

    • Surface Potential Investigation of Carbon Nanotube Field-Effect Transistor by Point-by-Point Atomic Force Microscope Potentiometry (2010)
  • Miyato Yuji ID: 9000401785352

    Articles in CiNii:1

    • Position Control and Electrical Characterization of Single-Walled Carbon Nanotubes Debundled by Density Gradient Ultracentrifugation (2010)
  • Miyato Yuji ID: 9000401808197

    Articles in CiNii:1

    • Investigations of Local Electrical Characteristics of a Pentacene Thin Film by Point-Contact Current Imaging Atomic Force Microscopy (2012)
  • Miyato Yuji ID: 9000402009056

    Articles in CiNii:1

    • Investigations of Local Electrical Characteristics of a Pentacene Thin Film by Point-Contact Current Imaging Atomic Force Microscopy (2012)
  • Miyato Yuji ID: 9000403170412

    Articles in CiNii:1

    • Surface structure switching between (1 × 1) and (1 × 2) of rutile TiO2(110) with scanning tunneling microscopy and low energy electron diffraction (2019)
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