Search Results1-20 of  84

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  • Mochiji Kozo ID: 9000025085785

    Articles in CiNii:1

    • Scanning Tunneling Microscopy Observation of Graphite Surfaces Irradiated with Size-Selected Ar Cluster Ion Beams (2005)
  • MOCHIJI KOZO ID: 9000253648655

    Central Research Laboratory, Hitachi Ltd . (1995 from CiNii)

    Articles in CiNii:1

    • Atomic Layer Etching by Using Multiply-Charged Ions. (1995)
  • MOCHIJI Kozo ID: 9000000022025

    日立製作所中央研究所 (1997 from CiNii)

    Articles in CiNii:5

    • STM-TOF:原子分解能を持つ元素分析 (1997)
    • Atomic Layer Etching by Using Multiply-Charged Ions (1995)
    • Expectation to "Beam-Induced Surface Reactions" (1997)
  • MOCHIJI Kozo ID: 9000000353269

    Joint Research Center for Atom Technology (2000 from CiNii)

    Articles in CiNii:1

    • Atomic-Layer Etching and Electron-Stimulated Desorption of Br-Chemisorbed Si(111) Surfaces (2000)
  • MOCHIJI Kozo ID: 9000005545935

    Central Research Laboratory, Hitachi, Ltd. (1997 from CiNii)

    Articles in CiNii:6

    • Thermal and Ion-Induced Reactions on a Chlorine-Adsorbed GaAs(100) Surface Studied by Metastable-Atom De-excitation Electron Spectroscopy (1995)
    • Selective Generation of Defects in Polydiacetylene Langmuir-Blodgett Films on Si Substrates as Studied by X-Ray Photoelectron Spectroscopy (1996)
    • Positive Charge Generation at a SiO_2/Si Interface due to Bombardment with Metastable Atoms (1997)
  • MOCHIJI Kozo ID: 9000005623835

    Central Research Ladoratory, Hitachi Ltd (1989 from CiNii)

    Articles in CiNii:1

    • The Effects of Secondary Electrons form a Silion Substrate on SR X-Ray Lithography : Lithography Technology : (1989)
  • MOCHIJI Kozo ID: 9000005646672

    Joint Research Center for Atom Technology, Angstrom Technology Partnership (JRCAT-ATP), c (1999 from CiNii)

    Articles in CiNii:1

    • Electron-Stimulated Desorption of a Br-Chemisorbed Si(111)-7x7 Surface by Using a Scanning Tunneling Microscope (1999)
  • MOCHIJI Kozo ID: 9000005659476

    Central Research Laboratory, Hitachi Ltd. (1995 from CiNii)

    Articles in CiNii:1

    • Trapping and Low-Energy Extraction of Photodissociated Ions of SF_6 (1995)
  • MOCHIJI Kozo ID: 9000005734120

    Central Research Laboratory, Hitachi, Ltd.:PRESTO, Research Development Corporation of Japan (JRDC) (1995 from CiNii)

    Articles in CiNii:1

    • Desorption of Ga and As Atoms from GaAs Surface Induced by Slow Multiply Charged Ar Ions (1995)
  • MOCHIJI Kozo ID: 9000005752242

    Central Research Laboratory, Hitachi Ltd. (1980 from CiNii)

    Articles in CiNii:1

    • Electron Beam Mask Fabrication for MOSLSI's with 1.5 μm Design Rule : A-1: ADVANCED LITHOGRAPHY AND PROCESS (1980)
  • MOCHIJI Kozo ID: 9000016377577

    Department of Mechanical and System Engineering, Graduate School of Engineering, University of Hyogo (2009 from CiNii)

    Articles in CiNii:1

    • Site-Specific Fragmentation of Polystyrene Molecule Using Size-Selected Ar Gas Cluster Ion Beam (2009)
  • MOCHIJI Kozo ID: 9000021531170

    PREST, Japan Science and Technology Corporation|Central Research Laboratory, Hitachi Ltd. (1999 from CiNii)

    Articles in CiNii:1

    • サマリー・アブストラクト (1999)
  • MOCHIJI Kozo ID: 9000107343838

    Department of Mechanical Engineering, Graduate School of Engineering, University of Hyogo (2005 from CiNii)

    Articles in CiNii:1

    • Electron-Induced Modification of Ethylene Molecules Chemisorbed on Si(100) Surface (2005)
  • MOCHIJI Kozo ID: 9000107344775

    Articles in CiNii:1

    • Atomic-Layer Etching of a Br-Saturated Si(111)-7x7 Surface by Using Scanning Tunneling Microscope (1999)
  • MOCHIJI Kozo ID: 9000253648472

    Central Research Laboratory, Hitachi Ltd. (1994 from CiNii)

    Articles in CiNii:1

    • Photon-Stimulated Ion Desorption from Chlorine-Adsorbed GaAs Surfaces. (1994)
  • MOCHIJI Kozo ID: 9000257983758

    Graduate School of Engineering, University of Hyogo (2010 from CiNii)

    Articles in CiNii:1

    • Soft-Sputtering SIMS by Using Argon Cluster Ions (2010)
  • MOCHIJI Kozo ID: 9000258089376

    Department of Mechanical and System Engineering, Graduate School of Engineering, University of Hyogo (2014 from CiNii)

    Articles in CiNii:1

    • Surface Sensitive Analysis of Organic Compound using Size-selected Ar Gas Cluster SIMS (2014)
  • MOCHIJI Kozo ID: 9000319049035

    兵庫県立大学工学研究科 (2016 from CiNii)

    Articles in CiNii:1

    • A New Method for Measuring Mechanical Properties of Surface by Using Dissociative Ion Scattering (2016)
  • Mochiji Kozo ID: 9000003389820

    PREST(JST):Central Research Laboratory(Hitachi) (1999 from CiNii)

    Articles in CiNii:1

    • 26pB-5 Applications of multiply-charged ions for nanometer-scale fabrications (1999)
  • Mochiji Kozo ID: 9000014441390

    Central Research Laboratory,Hitachi,Ltd. (1993 from CiNii)

    Articles in CiNii:1

    • Synchrotron-radiation induced desorption from chlorine-adsorbed GaAs surface (1993)
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