Search Results1-20 of  195

  • Munakata Chusuke ID: 9000024987780

    Articles in CiNii:1

    • Separation between Surface and Volume Decay Times of Photoconductivity in p-Type Silicon Wafers (2006)
  • MUNAKATA Chusuke ID: 9000000098539

    Central Research Laboratory, Hitachi, Ltd. (1997 from CiNii)

    Articles in CiNii:1

    • Monitoring of Ultra-Trace Contaminants on Silicon Wafers for ULSI by a Novel Impurity Extraction and AC Surface Photovoltage Methods (1997)
  • MUNAKATA Chusuke ID: 9000005523106

    Central Research Laboratory, Hitachi, Ltd. (1971 from CiNii)

    Articles in CiNii:1

    • Fine Chromium Grating Directly Made by Irradiating Electron Beam (1971)
  • MUNAKATA Chusuke ID: 9000005523368

    Central Research Laboratory, Hitachi Ltd. (1971 from CiNii)

    Articles in CiNii:1

    • A Scanning Electron Microscopic Method of Obtaining Electric Field Distributions Using Solid-State Models (1971)
  • MUNAKATA Chusuke ID: 9000005524784

    Department of Electrical Engineering and Computer Sciences, University of California (1972 from CiNii)

    Articles in CiNii:1

    • Frequency Dependence of the Diffusion Length for Excess Minority Carriers Generated with a Pulsed Electron Beam (1972)
  • MUNAKATA Chusuke ID: 9000005532483

    Central Research Laboratory, Hitachi Ltd., (1977 from CiNii)

    Articles in CiNii:1

    • Observations of Sand-Blasted Surface of Germanium with a Scanning Electron Microscope (1977)
  • MUNAKATA Chusuke ID: 9000005537015

    Central Research Laboratory, Hitachi Ltd. (1967 from CiNii)

    Articles in CiNii:1

    • An Electron Beam Method of Measuring Deffusion Voltage in Semiconductors (1967)
  • MUNAKATA Chusuke ID: 9000005546640

    Central Research Laboratory, Hitachi, Ltd. (1981 from CiNii)

    Articles in CiNii:1

    • Non-Destructive Method of Observing Inhomogeneities in p-n Junctions with a Chopped Photon Beam (1981)
  • MUNAKATA Chusuke ID: 9000005780449

    Central Research Laboratory, Hitachi Ltd. (1981 from CiNii)

    Articles in CiNii:1

    • A Novel Method of Electron Beam Recording on a Si Wafer (1981)
  • MUNAKATA Chusuke ID: 9000006460702

    Department of Electronics, Tohoku Institute of Technology (2002 from CiNii)

    Articles in CiNii:1

    • Charge Storage Effect in the Microwave Detected Photoconductive Decay Method (2002)
  • MUNAKATA Chusuke ID: 9000107338545

    Department of Electronics, Tohoku Institute of Technology (2004 from CiNii)

    Articles in CiNii:1

    • Field-Induced Positive Oxide Charge in Radiation-Damaged Oxide Layers on n-Type Silicon Wafers (2004)
  • MUNAKATA Chusuke ID: 9000107348577

    Department of Electronics, Tohoku Institute of Technology (2003 from CiNii)

    Articles in CiNii:1

    • Lateral Size Effect in the Lifetime Measurement by Frequency-Dependent Surface Photovoltage Technique (2003)
  • MUNAKATA Chusuke ID: 9000107351064

    Department of Electronics, Tohoku Institute of Technology (2007 from CiNii)

    Articles in CiNii:1

    • Surface and Volume Decay Times of Photoconductivity in n-Type Silicon Wafers (2007)
  • MUNAKATA Chusuke ID: 9000107352764

    Department of Electronics, Tohoku Institute of Technology (2005 from CiNii)

    Articles in CiNii:1

    • Density Distribution Profiles of Excess Minority Carriers Injected with 904-nm-Wavelength Laser Pulse into 400-μm-Thick Silicon Wafer (2005)
  • MUNAKATA Chusuke ID: 9000107377213

    Department of Electronics, Tohoku Institute of Technology (2003 from CiNii)

    Articles in CiNii:1

    • Estimation of Volume Lifetimes in Small Square Pillars of Silicon using Empirical Formulae (2003)
  • MUNAKATA Chusuke ID: 9000107391517

    Department of Electronics, Tohoku Institute of Technology (2004 from CiNii)

    Articles in CiNii:1

    • Analytical Estimation of Effective Lifetimes of Minority Carriers Injected with Laser Pulse into Dry-Oxidized p-Type Silicon Wafer (2004)
  • MUNAKATA Chusuke ID: 9000252844827

    Central Research Laboratory, Hitachi, Ltd. (1984 from CiNii)

    Articles in CiNii:1

    • Scanning Photon Microscope (1984)
  • Munakata Chusuke ID: 9000024940183

    Articles in CiNii:1

    • Decay times of impulse surface photovoltages in p-type silicon wafers (2007)
  • Munakata Chusuke ID: 9000252755034

    Central Research Laboratory, Hitachi, Ltd. (1971 from CiNii)

    Articles in CiNii:1

    • Analysis of Trapezoid Distortion due to Charge-Up in Electron Beam Recording (1971)
  • Munakata Chusuke ID: 9000252755177

    Department of Electrical Engineering and Computer Sciences, University of California (1972 from CiNii)

    Articles in CiNii:1

    • Effect of the Surface Recombination Velocity on the β-Conductive Signal (1972)
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