Search Results1-20 of  114

  • MUTO SHUNSUKE ID: 9000391858676

    Dept. of Materials, Physics, and Energy Engineering, Nagoya University (2007 from CiNii)

    Articles in CiNii:1

    • Site selective electronic structure analysis using EELS under channeling conditions and first principles calculations (2007)
  • MUTO SHUNSUKE ID: 9000391879746

    Nagoya U. (2009 from CiNii)

    Articles in CiNii:1

    • Site-selective EELS on transition metal oxides using electron channeling and its theoretical calculations (2009)
  • MUTO Shunsuke ID: 9000000355322

    Center for Integrated Research in Science and Engineering, Nagoya University (1999 from CiNii)

    Articles in CiNii:1

    • Molecular Dynamics Study on Local Atomic Displacements Associated with Point Defects and Displacive Phase Transformations (1999)
  • MUTO Shunsuke ID: 9000000405141

    Division of Energy Science, Center for Integrated Research in Science and Engineering, Nagoya University (2000 from CiNii)

    Articles in CiNii:1

    • Magnetic Field-Induced Martensitic Transformation and Giant Magnetostriction in Fe-Ni-Co-Ti and Ordered Fe_3 Pt Shape Memory Alloys (2000)
  • MUTO Shunsuke ID: 9000000790768

    Center for Integrated Research in Science and Engineering (CIRSE), Nagoya University (1999 from CiNii)

    Articles in CiNii:1

    • Fragmentation of graphite crystals by electron irradiation at elevated temperatures (1999)
  • MUTO Shunsuke ID: 9000000791024

    Center for Integrated Research in Science and Engineering (CIRSE), Nagoya University (1999 from CiNii)

    Articles in CiNii:1

    • Local structural order in electron-irradiated graphite studied by high-resolution high-voltage electron microscopy (1999)
  • MUTO Shunsuke ID: 9000001034610

    Centre for Integrated Research in Science and Engineering, Nagoya University (2003 from CiNii)

    Articles in CiNii:1

    • Reverse Monte Carlo analysis of extended energy-loss fine structure for disordered structures of tetrahedrally coordinated materials : its applicability (2003)
  • MUTO Shunsuke ID: 9000001198342

    Center for Integrated Research in Science and Engineering, Nagoya University (2002 from CiNii)

    Articles in CiNii:1

    • Development of new TEM specimen holder for cathodoluminescence detection (2002)
  • MUTO Shunsuke ID: 9000001274419

    Center for Integrated Research in Science and Engineering (CIRSE), Nagoya University (2000 from CiNii)

    Articles in CiNii:1

    • Application of spline wavelet transformation to the analysis of extended energy-loss fine structure (2000)
  • MUTO Shunsuke ID: 9000001344227

    Department of Materials, Physics and Energy Engineering, Nagoya University (2004 from CiNii)

    Articles in CiNii:1

    • Valence Change of Cations in Ceria-Zirconia Solid Solution Associated with Redox Reactions Studied with Electron Energy-Loss Spectroscopy (2004)
  • MUTO Shunsuke ID: 9000001452648

    Waseda University (2005 from CiNii)

    Articles in CiNii:2

    • A New Method for the Evaluation of the Heart Function by Surface Measurement (2005)
    • Clinical application of the navigation system for the neurosurgery in the intraoperative MRI-equipped operating theater using reflective ball markers (2004)
  • MUTO Shunsuke ID: 9000001829908

    Department of Materials, Physics and Energy Engineering, Graduate School of Engineering, Nagoya University (2005 from CiNii)

    Articles in CiNii:1

    • Substructures of Gas-Ion-Irradiation-Induced Surface Blisters in Silicon Studied by Cross-Sectional Transmission Electron Microscopy (2005)
  • MUTO Shunsuke ID: 9000002024363

    Department of Materials, Physics and Energy Engineering, Graduate School of Engineering, Nagoya University (2009 from CiNii)

    Articles in CiNii:5

    • Depth-Resolved EELS and Chemical State Mapping of N^+-Implanted TiO_2 Photocatalyst (2007)
    • Site-Selective Electronic Structure of Aluminum in Oxide Ceramics Obtained by TEM-EELS Analysis Using the Electron Standing-Wave Method (2007)
    • Spectral restoration and energy resolution improvement of electron energy-loss spectra by Pixon reconstruction : I. Principle and test examples (2006)
  • MUTO Shunsuke ID: 9000005597541

    Center for Integrated Research in Science and Engineering (CIRSE) (1999 from CiNii)

    Articles in CiNii:1

    • Change in Chemical Bonding States in Electron-Irradiated Graphite (1999)
  • MUTO Shunsuke ID: 9000005901704

    Center for Integrated Research in Science and Engineering, Nagoya University (2000 from CiNii)

    Articles in CiNii:1

    • Observation of Surface Blistering by Grazing Incidence electron Microscopy (2000)
  • MUTO Shunsuke ID: 9000014268470

    Department of Materials, Physics and Energy Engineering, Nagoya University (2009 from CiNii)

    Articles in CiNii:1

    • Local Electronic and Atomic Structure of Ce^<3+>-Containing Fluoride/Oxide Determined by TEM-EELS and First-Principles Calculations (2009)
  • MUTO Shunsuke ID: 9000016669633

    Department of Materials, Physics and Energy Engineering, Graduate School of Engineering, Nagoya University (2008 from CiNii)

    Articles in CiNii:1

    • Energy-drift correction of electron energy-loss spectra from prolonged data accumulation of low SNR signals (2008)
  • MUTO Shunsuke ID: 9000107309599

    Department of Material, Physics and Energy Engineering, Nagoya University (2012 from CiNii)

    Articles in CiNii:1

    • Mapping of Physical Properties in Nanometer-scale by Multivariate Spectrum Analysis (2012)
  • MUTO Shunsuke ID: 9000107324433

    Department of Nuclear Engineering, Graduate School of Engineering, Nagoya University (2004 from CiNii)

    Articles in CiNii:1

    • Structure of an Oxygen-Related Defect Complex in SiC Studied with Electron Energy-Loss Spectroscopy (2004)
  • MUTO Shunsuke ID: 9000107325746

    Department of Materials, Physics and Energy Engineering, Graduate School of Engineering, Nagoya University (2005 from CiNii)

    Articles in CiNii:1

    • Structure of Oxygen-Related Defect Centers in Ge_<1-x>Si_x Alloys Studied by Extended Energy-Loss Fine Structure Analysis (2005)
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