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  • NAKAZAWA Taiki ID: 9000018787337

    Graduate School of Engineering, Tohoku University (2014 from CiNii)

    Articles in CiNii:6

    • Highly Ultraviolet Light Sensitive and Highly Reliable Photodiode With Atomically Flat Si Surface (2011)
    • Reduction of Random Telegraph Noise with Broad Channel MOSFET (2011)
    • Photodiode Dopant Profile with Atomically Flat Si Surface for High Sensitivity and Stability to UV-light (2012)
  • Nakazawa Taiki ID: 9000258607640

    Graduate School of Engineering, Tohoku University (2014 from CiNii)

    Articles in CiNii:1

    • [Paper] A Highly Ultraviolet Light Sensitive and Highly Robust Image Sensor Technology Based on Flattened Si Surface (2014)
  • Nakazawa Taiki ID: 9000402021729

    Articles in CiNii:1

    • 2014-01-01 (2014)
  • Nakazawa Taiki ID: 9000402024129

    Articles in CiNii:1

    • 2014-06-01 (2014)
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