Search Results1-1 of  1

  • NAM Haeki ID: 9000003800049

    Yokohama National University (2003 from CiNii)

    Articles in CiNii:3

    • Effect of Voids on Thermal Fatigue Reliability of Lead Free Solder Joint (2002)
    • Effect of Hardening Rule on Nonlinear Strain Range Evaluation of Lead Free Solder Joint (2002)
    • Evaluation for Thermal Fatigue Life of Electronic Device Solder Joints utilizing Car (2003)
Page Top