Search Results1-20 of  70

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  • Nishida Akio ID: 9000025031000

    Articles in CiNii:1

    • Consideration of random dopant fluctuation models for accurate prediction of threshold voltage variation of metal-oxide-semiconductor field-effect transistors in 45nm technology and beyond (2009)
  • Nishida Akio ID: 9000025058358

    Articles in CiNii:1

    • Impact of oxide thickness fluctuation and local gate depletion on threshold voltage variation in metal-oxide-semiconductor field-effect transistors (2009)
  • Akio NISHIDA ID: 9000267842559

    Articles in CiNii:1

    • 私募債市場の日本的意義 (2010)
  • NISHIDA AKIO ID: 9000399259975

    Articles in CiNii:1

    • Government Support for SME Financing in a Slow Growth Economy: Lessons from Japan (2018)
  • NISHIDA AKIO ID: 9000403323148

    Articles in CiNii:1

    • 福岡県の自動車産業と地域金融機関 (2019)
  • NISHIDA Akio ID: 9000000166606

    Japan National Oil Corporation, Technology Research Center (2003 from CiNii)

    Articles in CiNii:5

    • Tomographic inversion for reservoir monitoring (1998)
    • Acoustic Wave Velocity Measurements of Pore Fluids at Reservoir Conditions (1999)
    • Tomographic inversion for reservoir monitoring -Part 2. (1999)
  • NISHIDA Akio ID: 9000001070275

    Semiconductor * Integrated Circuits Division, Hitachi, Ltd (2002 from CiNii)

    Articles in CiNii:1

    • A specimen-drift-free EDX mapping system in a STEM for observing two-dimensional profiles of low dose elements in fine semiconductor devices (2002)
  • NISHIDA Akio ID: 9000001720130

    Central Research Laboratory, Hitachi Ltd. (1996 from CiNii)

    Articles in CiNii:1

    • Influence of Ion Energy on Carrier Activation and Source/Drain Parasitic Resistance in Low-Energy Ion Implantation for 0.15-μm MOSFETs (1996)
  • NISHIDA Akio ID: 9000003635136

    Ube Research Laboratory, Ube Industries, Ltd. (1996 from CiNii)

    Articles in CiNii:1

    • Effects of Heating Atmospheres on Foaming Characteristics of Perlite (1996)
  • NISHIDA Akio ID: 9000003640074

    Inorganic Materials Department, Ube Research Laboratory Corporate Research and Development, Ube Industries, Ltd. (2002 from CiNii)

    Articles in CiNii:2

    • Preparation and Electrical Properties of Ba(Ti_<1-x>Zr_x)O_3 Thin Films by Hydrothermal Method (2002)
    • Preparation of PZT/PSZT Multilayer by Hydrothermal Method (2002)
  • NISHIDA Akio ID: 9000004779827

    Central Research Laboratory, Hitachi, Ltd. (1999 from CiNii)

    Articles in CiNii:4

    • Nanometer-size single-crystalline spheres and/or ultra fine structures relating to the Si spheres are believed to be the origin. (1992)
    • Limitation factors of drain current in 0.1-0.2μm MOSFET's (1999)
    • Limitation factors of drain current in 0.1-0.2μm MOSFET's (1999)
  • NISHIDA Akio ID: 9000005573992

    Hitachi, Ltd., Central Research Laboratory (1996 from CiNii)

    Articles in CiNii:1

    • In-Situ Measurement of He^+ Stopping in Si Layers by Low-Energy Ion-Scattering Spectroscopy (1996)
  • NISHIDA Akio ID: 9000006598820

    兵庫県美方郡香美町立射添中学校 (2007 from CiNii)

    Articles in CiNii:3

    • 兵庫県北部・但馬地方地域の自然を生かした教材作り : 香美町村岡区・小代区の「岩石マップ」 (2006)
    • アイスランドの氷河 : 海外野外調査体験 (2007)
    • 2K-08 授業に生かすアイスランドの地学素材(環境教育・STS教育・総合的学習,一般研究発表(口頭発表),日本理科教育学会第57回全国大会) (2007)
  • NISHIDA Akio ID: 9000016376887

    MIRAI-Selete (2011 from CiNii)

    Articles in CiNii:3

    • Random Threshold Voltage Variability Induced by Gate-Edge Fluctuations in Nanoscale Metal-Oxide-Semiconductor Field-Effect Transistors (2009)
    • Origin of Larger Drain Current Variability in N-Type Field-Effect Transistors Analyzed by Variability Decomposition Method (2010)
    • Three-Dimensional Structure Analysis of Metal-Oxide-Insulator Field Effect Transistors with Different Electrical Properties by Scanning Transmission Electron Microscopy (2011)
  • NISHIDA Akio ID: 9000020120827

    Articles in CiNii:1

    • Sinterability of Magnesia Powder Prepared by Vapor Phase Oxidation Process (1989)
  • NISHIDA Akio ID: 9000020152743

    Articles in CiNii:1

    • Effect of Grain Size on Mechanical Properties of High-Purity Polycrystalline Magnesia (1990)
  • NISHIDA Akio ID: 9000020181326

    Articles in CiNii:1

    • Effects of Grain Size and Artificial Crack Length on Bending Strength of MgO Sintered Body. (1993)
  • NISHIDA Akio ID: 9000020212360

    Articles in CiNii:1

    • Effects of Grain Size and Surface Roughness on Bending Strength of MgO Sintered Body. (1993)
  • NISHIDA Akio ID: 9000020594262

    Articles in CiNii:1

    • Effects of Annealing on Properties of MgO-ZrO<sub>2</sub> Composite Ceramics (1992)
  • NISHIDA Akio ID: 9000020621490

    Articles in CiNii:1

    • Grain Size Effect on Mechanical Strength of MgO-ZrO<sub>2</sub> Composite Ceramics (1992)
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