Search Results1-20 of  51

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  • NAKANISHI Toshiro ID: 9000001620396

    Fujitsu Labs. Ltd. (2005 from CiNii)

    Articles in CiNii:1

    • Improvement in Retention/Program Time Ratio of Direct Tunneling Memory (DTM) for Low Power SoC Applications(Memory, <Special Section>Low-Power LSI and Low-Power IP) (2005)
  • NAKANISHI Toshiro ID: 9000001719173

    Fujitsu Laboratories Ltd. (2000 from CiNii)

    Articles in CiNii:1

    • Dual-Thickness Gate Oxidation Technology with Halogen/Xenon Implantation for Embedded DRAMs (2000)
  • NAKANISHI Toshiro ID: 9000001722569

    Fujitsu Laboratories Ltd. (1995 from CiNii)

    Articles in CiNii:1

    • Identification of MOS Gate Dielectric-Breakdown Spot Using High-Selectivity Etching (1995)
  • NAKANISHI Toshiro ID: 9000002170502

    FUJITSU LABORATOIRES Ltd. (2005 from CiNii)

    Articles in CiNii:1

    • Ultra High Density HfO2-Nanodot Memory for Flash Memory Scaling (2005)
  • NAKANISHI Toshiro ID: 9000003009879

    Agricultural Chemicals Research Laboratories, Sankyo Co., Ltd. (1983 from CiNii)

    Articles in CiNii:1

    • Mode of Action of Hymexazol in Pythium aphanidermatum (1983)
  • NAKANISHI Toshiro ID: 9000003010423

    三共農薬研 (1988 from CiNii)

    Articles in CiNii:36

    • Structure-activity Relationships of N-Aryl-4-carboxy- and N-Aryl-4-hydroxy-phthalimides in Control of Plasmodiophora Disease (1987)
    • Preventive Activity of N-(2, 6-Dialkylphenyl)-4-carboxyphthalimides and Related Compounds against Plasmodiophora Disease (1987)
    • (202) ジクロメジンの病害防除作用に関する研究 : (第1報) イネ紋枯病防除効果 (昭和58年度日本植物病理学会大会講演要旨) (1983)
  • NAKANISHI Toshiro ID: 9000004838260

    Fujitsu Limited & Fujitsu Laboratories Ltd. (2009 from CiNii)

    Articles in CiNii:8

    • Oxidation of Silicon in Ultradry Ozone (1995)
    • Spurious Suppression Effect by Transmit Bandpass Filters with HTS Dual-Mode Resonators for 5GHz Band (2009)
    • A Novel Filter Construction Utilizing HTS Reaction-Type Filter to Improve Adjacent Channel Leakage Power Ratio of Mobile Communication Systems (2009)
  • NAKANISHI Toshiro ID: 9000004918586

    富士通研究所 (2001 from CiNii)

    Articles in CiNii:5

    • High Quality Ultra-Thin Gate Oxide using UV/O_3 Surface Pre-Treatment of Native Oxide (1995)
    • High Performance & Highly reliable Deep Submicron CMOS-FETs using Nitrided-Oxide (1999)
    • Improvement of Hot Carrier Immunity in 0.18 μm CMOS with NO-Anneated Sidewall (1998)
  • NAKANISHI Toshiro ID: 9000006897184

    Human-Environment Studies Kyushu University (2005 from CiNii)

    Articles in CiNii:2

    • 40045 Measurements of vibration from Shinkansen and conventional railway : Effects of vibration on community response to noise Part1 (2005)
    • 40046 Community response to Shinkansen and conventional railway noise : Effects of vibration on community response to noise Part2 (2005)
  • NAKANISHI Toshiro ID: 9000020934837

    Department of Orthpaedic Surgery, Showa University School of Medicine (2000 from CiNii)

    Articles in CiNii:1

    • EXPERIMENTAL STUDY OF ANTIBIOTIC-IMPREGNATED POLYMETHYLMETHACRYLATE BEADS (2000)
  • NAKANISHI Toshiro ID: 9000021006237

    Agricultural Chemicals Research Laboratories, Sankyo Co. (1987 from CiNii)

    Articles in CiNii:1

    • N-(2,6-dialkylphenyl)-4 (or 3)-substituted phthalimides : Synthesis and preventive activity against Plasmodiophora disease. (1987)
  • NAKANISHI Toshiro ID: 9000021028987

    Agricultural Chemicals Research Laboratories, Sankyo Co. (1988 from CiNii)

    Articles in CiNii:1

    • Modification of imidocarbonyl group of N-(2,6-dialkylphenyl)-4-carboxy- and -hydroxy-phthalimides: Synthesis and preventive activity against Plasmodiophora disease. (1988)
  • NAKANISHI Toshiro ID: 9000021089565

    Department of Orthopeadics, Kameda General Hospital (2002 from CiNii)

    Articles in CiNii:1

    • TWO CASES OF ACUTE SPINAL EPIDURAL HEMATOMA DURING ANTICOAGULANT THERAPY (2002)
  • NAKANISHI Toshiro ID: 9000021614203

    Department of Orthopedics, Kameda General Hospital (1992 from CiNii)

    Articles in CiNii:1

    • LUXATIO ERECTA HUMERI —CASE REPORT— (1992)
  • NAKANISHI Toshiro ID: 9000107306719

    Fujitsu Laboratories Ltd. (2003 from CiNii)

    Articles in CiNii:1

    • High Reliable Dynamic Random Access Memory Technology for Application Specific Memory with Dual Nitrogen Concentration Gate Oxynitrides Using Selective Nitrogen Implantation (2003)
  • NAKANISHI Toshiro ID: 9000107334365

    Fujitsu Laboratories, Ltd. (2001 from CiNii)

    Articles in CiNii:1

    • Dual-Thickness Gate Oxidation Technology with Halogen/Xenon Implantation for Embedded Dynamic Random Access Memories (2001)
  • NAKANISHI Toshiro ID: 9000107343626

    Fujitsu Limited, Fujitsu Laboratories Ltd. (2005 from CiNii)

    Articles in CiNii:1

    • Device Design of Direct Tunneling Memory (DTM) Using Technology Computer Aided Design (TCAD) for Low-Power RAM Applications (2005)
  • NAKANISHI Toshiro ID: 9000107347364

    Articles in CiNii:1

    • High-Density Layer at the SiO_2/Si Interface Observed by Difference X-Ray Reflectivity (1996)
  • NAKANISHI Toshiro ID: 9000254161334

    Articles in CiNii:1

    • Mechanism of Selective Toxicity of Fungicide:Metabolism of Pentachloronitrobenzene by Phytopathogenic Fungi (1969)
  • NAKANISHI Toshiro ID: 9000254161400

    Articles in CiNii:1

    • Microbial Conversion of Pentachloronitrobenzene in Soil (1972)
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