Search Results1-18 of  18

  • NAKANO Motoo ID: 9000005533863

    IC Division, Fujitsu Limited (1980 from CiNii)

    Articles in CiNii:1

    • Anomalous Leakage Current of MOSFET's under BT Stress (1980)
  • NAKANO Motoo ID: 9000005752037

    IC Division, Fujitsu Limited (1980 from CiNii)

    Articles in CiNii:2

    • A CMOS/SOS Synchronous Static RAM Fabricated with an Advanced SOS Technology : A-2: MOS DEVICE AND LIST (2) (1979)
    • Charge Pumping Memory with SOS-MOS Transistors : A-3: LASER ANNEALING/SOS DEVICES (1980)
  • NAKANO Motoo ID: 9000020320763

    Fujitsu Limited (1967 from CiNii)

    Articles in CiNii:1

    • Properties of Vapour Grown Silicon Nitride Films (1967)
  • NAKANO Motoo ID: 9000253323434

    IC Development Division, Fujitsu Limited. (1985 from CiNii)

    Articles in CiNii:1

    • Three Dimensional IC (1985)
  • NAKANO Motoo ID: 9000404502805

    Articles in CiNii:1

    • Metal Plung Formation by Excimer Laser Induced Melting for Submicron Interconnect (1991)
  • Nakano Motoo ID: 9000252940499

    Semiconductor Division, Fujitsu Limited (1974 from CiNii)

    Articles in CiNii:1

    • Substrate Bias Characteristics of <SUP>31</SUP>P<SUP>+</SUP> Implanted <I>N</I>-Channel MOS FET (1974)
  • Nakano Motoo ID: 9000252947540

    IC Division, Fujitsu Limited (1980 from CiNii)

    Articles in CiNii:1

    • Anomalous leakage current of MOSFET's under BT stress. (1980)
  • Nakano Motoo ID: 9000252949812

    Fujitsu Limited (1981 from CiNii)

    Articles in CiNii:1

    • Lateral Epitaxial Growth in Poly-Si Film over SiO<SUB>2</SUB> from Single-Si Seed by Scanning CW Ar Laser Annealing (1981)
  • Nakano Motoo ID: 9000252965886

    Advanced Technology Division, Fujitsu Limited (1988 from CiNii)

    Articles in CiNii:1

    • Degradation in Bi–Sr–Ca–Cu–O Thin Films Exposed to Water (1988)
  • Nakano Motoo ID: 9000392677797

    Articles in CiNii:1

    • Substrate Bias Characteristics of <SUP>31</SUP>P<SUP>+</SUP> Implanted <I>N</I>-Channel MOS FET (1974)
  • Nakano Motoo ID: 9000392684921

    Articles in CiNii:1

    • Lateral Epitaxial Growth in Poly-Si Film over SiO<SUB>2</SUB> from Single-Si Seed by Scanning CW Ar Laser Annealing (1981)
  • Nakano Motoo ID: 9000392696446

    Articles in CiNii:1

    • Degradation in Bi–Sr–Ca–Cu–O Thin Films Exposed to Water (1988)
  • Nakano Motoo ID: 9000401578277

    Articles in CiNii:1

    • Substrate Bias Characteristics of31P+ImplantedN-Channel MOS FET (1974)
  • Nakano Motoo ID: 9000401586454

    Articles in CiNii:1

    • Anomalous Leakage Current of MOSFET's under BT Stress (1980)
  • Nakano Motoo ID: 9000401589198

    Articles in CiNii:1

    • Lateral Epitaxial Growth in Poly-Si Film over SiO2from Single-Si Seed by Scanning CW Ar Laser Annealing (1981)
  • Nakano Motoo ID: 9000401609934

    Articles in CiNii:1

    • Degradation in Bi-Sr-Ca-Cu-O Thin Films Exposed to Water (1988)
  • Nakano Motoo ID: 9000402054350

    Articles in CiNii:1

    • A CMOS/SOS Synchronous Static RAM Fabricated with an Advanced SOS Technology (1979)
  • Nakano Motoo ID: 9000402054412

    Articles in CiNii:1

    • Charge Pumping Memory with SOS-MOS Transistors (1980)
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