Search Results1-20 of  103

  • NIHEI YOSHIMASA ID: 9000003135623

    Faculty of Science & Technology, Tokyo University of Science (2005 from CiNii)

    Articles in CiNii:7

    • 田中耕一氏(Koichi TANAKA 株式会社島津製作所・フェロー) (2003)
    • Photoemission by X-ray Surface Analysis (2003)
    • 日本化学会に期待すること (2004)
  • NIHEI YOSHIMASA ID: 9000253160441

    Institute of Industrial Science, University of Tokyo (1991 from CiNii)

    Articles in CiNii:1

    • QUANTITATIVE ANALYSIS OF SMALL PARTICLES BY SUBMICRON SECONDARY ION MASS SPECTROMETRY (1991)
  • NIHEI YOSHIMASA ID: 9000253160442

    Institute of Industrial Science, University of Tokyo (1991 from CiNii)

    Articles in CiNii:1

    • SUBMICRON SECONDARY ION MASS SPECTROMETER FOR THREE-DIMENSIONAL ANALYSIS OF MICROSTRUCTURE (1991)
  • NIHEI YOSHIMASA ID: 9000253160482

    Institute of Industrial Science, University of Tokyo (1991 from CiNii)

    Articles in CiNii:1

    • CHARACTERIZATION OF TRACE AMOUNTS OP ODORANT S DISCHARGED FROM SEVERAL ODOR SOURCES FOR THE EXPLANATION OF THE RELATIONSHIP BETWEEN SENSORY RESPONSE TO ODORS AND CHEMICAL ANALYSIS DATA (1991)
  • NIHEI YOSHIMASA ID: 9000253160636

    Institute of Industrial Science, University of Tokyo (1991 from CiNii)

    Articles in CiNii:1

    • A CHEMICAL-STATE-DISCRIMINATED XPED STUDY ON STRUCTURE OF CaO FORMED BY ELECTRON BOMBARDMENT ON CaF<sub>2</sub> (111) (1991)
  • NIHEI YOSHIMASA ID: 9000253161403

    Institute of Industrial Science, University of Tokyo (1991 from CiNii)

    Articles in CiNii:1

    • SOURCE APPORTIONMENT OF AIRBORNE SUSPENDED PARTICULATES BY INDIVIDUAL PARTICLE ANALYSIS (1991)
  • NIHEI Yoshimasa ID: 1000010011016

    Research Institute for Science and Technology, Tokyo University of Science (2008 from CiNii)

    Articles in CiNii:70

    • 1998年度日本分析化学会学会賞を受賞される 鎌田薩男氏 (1998)
    • X-ray Fluorescence Holography (1998)
    • Source Apportionment of Individual Airborne Particle in Underground Center by Using Electron Probe Microanalyzer (1996)
  • NIHEI Yoshimasa ID: 9000002110160

    Department of Pure and Applied Chemistry, Faculty of Science and Technology, Tokyo University of Science (2008 from CiNii)

    Articles in CiNii:1

    • Removal Properties of Diesel Exhaust Particles by a Dielectric Barrier Discharge Reactor (2008)
  • NIHEI Yoshimasa ID: 9000005591070

    Institute of Industrial Science, University of Tokyo (1998 from CiNii)

    Articles in CiNii:1

    • Theoretical Studies of Element-Specific Kikuchi-Band Effects in X-Ray Photoelectron Diffraction (1998)
  • NIHEI Yoshimasa ID: 9000005676544

    Institute of Industrial Science, University of Tokyo (1997 from CiNii)

    Articles in CiNii:1

    • Site-Specific Extinction Rule for Kikuchi Bands in X-ray Photoelectron Diffraction (1997)
  • NIHEI Yoshimasa ID: 9000006892305

    Department of Pure and Applied Chemistry, Faculty of Science and Technology, Tokyo University of Science (2009 from CiNii)

    Articles in CiNii:1

    • Nanoparticles Transferred from Pregnant Mice to Their Offspring Can Damage the Genital and Cranial Nerve Systems (2009)
  • NIHEI Yoshimasa ID: 9000013976729

    東京理科大学理工学部, 日本分析化学会 (2004 from CiNii)

    Articles in CiNii:3

    • 日本分析化学会のこれから (2003)
    • 未来に向けての前進計画 (2004)
    • 機器分析法の基礎知識--光電子分光法 (1987)
  • NIHEI Yoshimasa ID: 9000014186543

    Tokyo University of Science (2008 from CiNii)

    Articles in CiNii:2

    • Let Us Celebrate the Rebirth of Our Society : SSSJ (2008)
    • 科学と技術の国際競争力 (2008)
  • NIHEI Yoshimasa ID: 9000015751143

    Faculty of Industrial Science and Technology, Tokyo University of Science (2003 from CiNii)

    Articles in CiNii:1

    • Development of a Supercritical Fluid Extractor Coupled with a Time-of-Flight Mass Spectrometer for Online Detection of Extracts (2003)
  • NIHEI Yoshimasa ID: 9000020206151

    Department of Industrial Chemistry, Faculty of Engineering, University of Tokyo (1974 from CiNii)

    Articles in CiNii:1

    • Light Detection and Data Processing (5) Applications of Digital Computers:I. General Survey (1974)
  • NIHEI Yoshimasa ID: 9000020406318

    Institute of Industrial Science, University of Tokyo (1978 from CiNii)

    Articles in CiNii:1

    • Characterization of solid surfaces by means of combined electron spectroscopy (XPS-SEM-microAES).:XPS-SEM-MicroAES (1978)
  • NIHEI Yoshimasa ID: 9000020573361

    Institute of Industrial Science, University of Tokyo (1980 from CiNii)

    Articles in CiNii:1

    • Angle-Resolved X-Ray Photoelectron Spectroscopy (ARXPS) as a New Tool for Solid Surface Characterization (1980)
  • NIHEI Yoshimasa ID: 9000020653070

    Articles in CiNii:1

    • Three-dimensional analysis of inorganic microcapsules by submicron SIMS using a gallium focused ion beam. (1991)
  • NIHEI Yoshimasa ID: 9000020658072

    Institute of Industriai Science, University of Tokyo (1983 from CiNii)

    Articles in CiNii:1

    • X-Ray Photoelectron Diffraction (XPED) Measurements by Using High Performance Angle-Resolved X-Ray Photoelectron Spectrometer (ARXPS) (1983)
  • NIHEI Yoshimasa ID: 9000020658275

    Institute of Industrial Science, The University of Tokyo (1982 from CiNii)

    Articles in CiNii:1

    • Surfaces and Spectroscopy (1982)
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